Elmet Orasson

https://www.etis.ee/CV/Elmet_Orasson/est
18.06.1974
6202263
elmet@pld.ttu.ee

Teenistuskäik

Töökohad ja ametid
01.01.2017–...   
Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut, Assistent (0,75)
01.09.2016–31.12.2016   
Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut, Arvutisüsteemide diagnostika ja verifitseerimise õppetool , Assistent (0,75)
01.09.2004–31.08.2016   
Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut, Arvutisüsteemide diagnostika ja verifitseerimise õppetool , Teadur (1,00)
2001–2005   
Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut, Arvutisüsteemide diagnostika ja verifitseerimise õppetool , vaneminsener (0,75)
1998–2001   
Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut, Arvutisüsteemide diagnostika ja verifitseerimise õppetool , insener (0,50)
1994–1998   
Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Automaatikainstituut, Siduteooria ja -disaini õppetool, insener (0,50)
 
 
Haridustee
2003–2007   
Doktorikraad (arvuti- ja süsteemitehnika), TTÜ
2001–2002   
Tehnikateaduste magister, TTÜ
1992–2001   
Dip. Eng, Arvuti- ja süsteemitehnika õppevaldkond, TTÜ
1989–1992   
Fr. R. Kreutzwaldi nim. Võru I Keskkool (Võru Kreutzwaldi Gümnaasium)
 
 
Teadusorganisatsiooniline ja -administratiivne tegevus
2005−2005   
European Test Symposium 2005
2005−2005   
Europan Board Test Workshop 2005
2000−2000   
Baltic Electronic Conference 2000 korraldamise abitööd
 
 
Teenistuskäigu lisainfo
Laboratoorsed tööd aines IAF0041 Arvutid I
K16 - 73 tudengit, 6 rühma x 8 laboritundi + lisaajad
K15 - 62 tudengit, 4 rühma x 8 laboritundi + lisaajad
K14 - 58 tudengit, 4 rühma x 8 laboritundi + lisaajad

Laborijuhendi täiendamine ja ISE keskkonna projektialuste loomine;
Laboratoorsed tööd aines IAF0050 Digitaalsüsteemide diagnostika, päevane ja kaugõpe.

K16, 29 tudengit x 1 rühm x 14 laboritundi + kaugõpe x 4 laboritundi
K15, 56 tudengit x 3 rühma x 14 laboritundi + 16 kaugõppurit x 4 laboritundi
K14, 53 tudengit x 2 rühma x 14 laboritundi + 12 kaugõppurit x 4 laboritundi

Laborijuhendi muudatused jooksva semestri tarbeks.;
Laboratoorsed tööd aines IAF0610 Testimise projekteerimine
S15, 9 tudengit x 1 rühm
S14, 16 tudengit x 1 rühm
S13, 9 tudengit x 1 rühm;
Kaitsmiskomisjoni töös osalemine
2 magistritööde komisjoni + 1 magistritöö retsensioon
3 bakalaureusetööde komisjoni;

Kvalifikatsioon

Teaduskraadid
Elmet Orasson, doktorikraad, 2007, (juh) Raimund Ubar, Hybrid Built-In Self-Test - Methods and Tools for Analsysis and Optimizatuion of BIST (Sisseehitatud hübriidne isetestimine - Meetodid ja vahendid analüüsiks ning optimeerimiseks), Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut, Arvutisüsteemide diagnostika ja verifitseerimise õppetool.
Elmet Orasson, magistrikraad (teaduskraad), 2002, (juh) Raimund Ubar, Digitaalsüsteemide testi- ja diagnostikaalase õppetarkvara arendus, Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut.
 
 
Teaduspreemiad ja tunnustused
2004, Elmet Orasson, EITSA Tiigriülikooli stipendiaat
2003, Elmet Orasson, EITSA Tiigriülikooli stipendiaat
 
 
Teadustöö põhisuunad
VALDKOND: 4. Loodusteadused ja tehnika; 4.6. Arvutiteadused; CERCS ERIALA: T120 Süsteemitehnoloogia, arvutitehnoloogia
VALDKOND: 4. Loodusteadused ja tehnika; 4.8. Elektrotehnika ja elektroonika; PÕHISUUND: Digitaalsüsteemide istestimine

Jooksvad projektid

Publikatsioonid

Klass
Aasta
Publikatsioon
 
3.1.
2016
Kostin, Sergei; Orasson, Elmet; Ubar, Raimund (2016). A Tool Set for Teaching Design-for-Testability of Digital Circuits. In: Proc. of 11th European Workshop on Microelectronics Education. Southampton (1−6). IEEE Computer Society Press.
3.1.
2016
Ubar, R.; Jürimägi, L.; Orasson, E.; Raik, J. (2016). Scalable Algorithm for Structural Fault Collapsing in Digital Circuits. In: Y.Shin, C.Tsui, J.Kim, K.Choi, R.Reis (_EditorsAbbr). VLSI-SoC: Design for Reliability, Security, and Low Power (23−45). Springer.
3.1.
2016
Kostin, Sergei; Orasson, Elmet; Ubar, Raimund (2016). A Tool Set for Teaching Design-for-Testability of Digital Circuits. Proc. of 11th European Workshop on Microelectronics Education. Southampton, UK, May 11-13, 2016. IEEE Computer Society Press, 1−6.
3.1.
2016
Ubar, Raimund; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan (2016). Fault Collapsing in Digital Circuits Using Fast Fault Dominance and Equivalence Analysis with SSBDDs. In: Eds. Y.Shin, C.Tsui, J.Kim, K.Choi, R.Reis (_EditorsAbbr). VLSI-SoC: Design for Reliability, Security, and Low Power (23−45). Springer.
3.1.
2015
Ubar, Raimund; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan (2015). Scalable Algorithm for Structural Fault Collapsing in Digital Circuits. IFIP/IEEE International Conference on Very Large Scale Integration - VLSI-SoC'2015 (1−6). Oct. 5-7, 2015, Daejeon, Korea : IEEE Computer Society Press.
3.1.
2015
Ubar, Raimund; Jürimägi, Lembit; Orasson, Elmet; Josifovska, Galina; Oyeniran, Stephen Adeboye (2015). Double Phase Fault Collapsing with Linear Complexity in Digital Circuits. 18th Euromicro Conference on Digital Systems Design - DSD 2015 (1−6).. Funchal, Madeira, Portugal August 26-28, 2015: IEEE Computer Society Press.
3.1.
2012
Kruus, H.; Ubar, R.; Ellervee, P.; Gorev, M.; Pesonen, V.; Devadze, S.; Orasson, E.; Brik, M.; Min, M.; Annus, P.; Kruus, M.; Meigas, K. (2012). A Benchmark Suite for Evaluating the Efficiency of Test Tools. BEC 2012 : 13th biennial Baltic Electronics Conference : proceedings of the 13th biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2012, Tallinn, Estonia. Tallinn, 2012: The 13th Biennial Baltic Electronics Conference (BEC2012). Tallinn University of Technology, 85−88.
3.2.
2012
Ubar, Raimund; Kostin, Sergei; Orasson, Elmet; Evartson, Teet; Brik, Marina (2012). A Tool for Teaching Hierarchical Fault Diagnosis in Digital Circuits. Proc. of 9th European Workshop on Microelectronics Education – EWME’12. Grenoble, France: CNRS, 1−4.
3.2.
2010
Ubar, Raimund; Jutman, Artur; Raik, Jaan; Devadze, Sergei; Aleksejev, Igor; Chepurov, Anton; Chertov, Anton; Kostin, Sergei; Orasson, Elmet; Wuttke, H.-D. (2010). E-Learning Environment for WEB-Based Study of Testing. Proc. of the 8th European Workshop on Microelectronics Education - EWME 2010: 8th European Workshop on Microelectronics Education - EWME 2010. Saksamaa, Darmstadt, 47−52.
3.2.
2009
Ubar, R.; Raik, J.; Mironov, D.; Evartson, T.; Orasson, E.; Wuttke, H.-D.; Aarna, M. (2009). Teaching Diagnostic Modeling of Digital Systems with Decision Diagrams. Proc. of 12th IASTED Int. Conf. on Computers and Advanced Technology in Education – CATE 2009: 12th IASTED Int. Conf. on Computers and Advanced Technology in Education – CATE 2009, St. Thomas US, Nov. 22-24, 2009. ACTA Press, 1−6.
1.1.
2008
Jervan, G.; Orasson, E.; Kruus, H.; Ubar, R. (2008). Hybrid BIST Optimization Using Reseeding and Test Set Compaction. Microprocessors and Microsystems: Embedded Hardware Design, 32, 254−262.
1.2.
2007
Ubar, R.; Jutman, A.; Kruus, M.; Orasson, E.; Devadze, S.; Wuttke, H.-D. (2007). Learning Digital Test and Diagnostics via Internet. International Journal of Online Engineering, 3 (1), 1−9.
3.1.
2007
Jervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund (2007). Hybrid BIST Optimization Using Reseeding and Test Set Compaction. Proceedings of 10th EUROMICRO Conference on Digital System Design: 10th EUROMICRO Conference on Digital System Design (DSD 2007), Lübeck, Germany, 29-31 August 2007. IEEE Computer Society Press, 596−603.
3.1.
2007
Jervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund (2007). Optimization of Memory-Constrained Hybrid BIST for Testing Core-Based Systems. Proceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems - SIES'2007: IEEE 2nd International Symposium on Industrial Embedded Systems - SIES'2007, Lisbon, Portugal, 4-6 July 2007. IEEE Computer Society, 71−77.10.1109/SIES.2007.4297319.
3.1.
2006
Ubar, R.; Jervan, G.; Kruus, H.; Orasson, E.; Aleksejev, I. (2006). Optimization of the Store-and-Generate Based Built-In Self-Test. Proceedings of the 2006 International Baltic Electronic Conference: 10th Biennial Baltic Electronics Conference, Laulasmaa, Estonia, October 2-4, 2006. IEEE Computer Society Press, 199−202.10.1109/BEC.2006.311097.
3.5.
2006
Orasson, E (2006). E-learning software for digital test. Info- ja kommunikatsioonitehnoloogia doktorikooli aastakonverentsi artiklite kogumik (133−134).. Tallinna Tehnikaülikool.
3.1.
2005
Ubar, R.; Orasson, E.; Raik, J.; Wuttke, H. D. (2005). Teaching Advance Test Issues in Digital Electronics. ITHET 6th Annual International Conference, Juan Dolio, Dominican Republic.
3.4.
2005
Jutman, A.; Raik, J.; Orasson, E.; Ubar, R. (2005). Overview of the Educational Tools developed in REASON. Workshop on REsearch and Training Action for System on Chip DesigN – REASON, Tallinn, May 21, 2005.
3.1.
2004
Vislogubov, V; Jutman, Artur; Kruus, Helena; Orasson, Elmet; Raik, Jaan; Ubar, Raimund (2004). Diagnostic software with WEB interface for teaching purposes. BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia, 255−258.
3.4.
2004
Raik, J.; Orasson, E.; Ubar, R. (2004). Sequential Circuits BIST with Status BIT Control. Mixed design of integrated circuits and systems: International Conference MIXDES, Szczecin, Poland, 2004. 507−510.
3.4.
2004
Ubar, R.; Mazurova, N.; Smahtina, J.; Orasson, E.; Raik, J. (2004). HyFBIST: Hybrid Functional Built-In Self-Test in Microprogrammed Data-Paths of Digital Systems. Mixed design of integrated circuits and systems: MIXDES, Szczecin, Poland, 2004. 497−502.
3.4.
2004
Kruus, H.; Orasson, E.; Robal, T.; Ubar, R. (2004). Investigating Defects in Digital Circuits by Boolean Differential Equations. The 4th International Conference "Distance Learning - Educational Sphere of XXI Century": DLESC'04, Minsk, November 10-13, 2004. 432−435.
3.4.
2004
Ivask, E.; Jutman, A.; Orasson, E.; Raik, J.; Ubar, R.; Wuttke, H.-D. (2004). Research Environment for Teaching Digital Test. Proc. of 49. Int. Conf. IWK, Ilmenau, Germany, September 27-30, 2004: 49. Int. Conf. IWK, Ilmenau, Germany, September 27-30, 2004. 468−473.
1.2.
2003
Aarna, M.; Ivask, E.; Jutman, A.; Orasson, E.; Raik, J.; Ubar, R.; Vislogubov, V.; Wuttke, H.-D. (2003). Turbo Tester - Diagnostic Package for Research and Training. Radioelectronics & Informatics, 3 (24), 69−73.
3.1.
2003
Ubar, R.; Orasson, E. (2003). E-Learning tool and Exercises for Teaching Digital Test. 2nd IEEE Conference on Signals, Systems, Decision and Information Technology: Sousse, Tunisia, 2003. IEEE, 134.
3.4.
2003
Devadze, S.; Gorjachev, R.; Jutman, A.; Orasson, E.; Rosin, V.; Ubar, R. (2003). E-Learning Tools for Digital Test. Distance Learning – Educational Environment of the XXI Century: Minsk, Nov. 13-15, 2003. 336−342.
3.2.
2002
Ubar, R.; Orasson, E.; Evartson, T. (2002). Java Applet for Self-Learning of Digital Test Issues. Proceedings of 13th EAEEIE Conference: York, Great Britain.
3.2.
2002
Ubar, R.; Jutman, A.; Orasson, E.; Raik, J.; Evartson, T.; Wuttke, H.-D. (2002). Internet-Based Software for Teaching Test of Digital Circuits. Proceedings of 4th European Workshop on Microelectronics Education: EWME’02, Parador de Baiona, Spain, May 23-24, 2002. 317−320.
3.4.
2002
Ubar, R.; Orasson, E.; Evartson, T. (2002). Self-learning tool for digital test. 2nd Int. Conf. "Distance learning - educational sphere of the XXI century", Minsk, Belarus. 36−38.
3.4.
2002
Ubar, R.; Orasson, E.; Wuttke, H.-D. (2002). Internet-Based Software for Teaching Test of Digital Circuits. 23rd International Conference on Microelectronics, 2: 23rd International Conference on Microelectronics, Nis, Yugoslavia, 2002. IEEE, 659−662.
3.1.
2001
Ubar, Raimund; Jervan, Gert; Peng, Zebo; Orasson, Elmet; Raidma, Rein (2001). Fast Test Cost Calculation for Hybrid BIST in Digital Systems. Euromicro Symposium on Digital Systems Design, Warsaw, Poland, Sept. 4-6, 2001. IEEE Computer Society Press, 318−325.
3.4.
2000
Ubar, Raimund; Orasson, E; Raik, Jaan; Wuttke, H (2000). Combining learning, training and research in laboratory course for design and test. 7th Baltic Electronics Conference, Tallinn, October 8-11. 221−224.
3.4.
2000
Ubar, R.; Orasson, E.; Wuttke, H.-D. (2000). Interactive Teaching Software 'Introduction To Digital Test'. 45th International Conference, Ilmenau, Germany, 2000. 949−954.
25.04.2019

Elmet Orasson

https://www.etis.ee/CV/Elmet_Orasson/eng
18.06.1974
6202263
elmet@pld.ttu.ee

Career

Institution(s) and position(s)
01.01.2017–...   
Tallinn University of Technology , School of Information Technologies, Department of Computer Systems, Assistant (0,75)
01.09.2016–31.12.2016   
Tallinn University of Technology , School of Information Technologies, Department of Computer Engineering , Chair of Computer Systems Test and Verification, Assistant (0,75)
01.09.2004–31.08.2016   
Tallinn University of Technology , School of Information Technologies, Department of Computer Engineering , Chair of Computer Systems Test and Verification, Researcher (1,00)
2001–2005   
Tallinn University of Technology , School of Information Technologies, Department of Computer Engineering , Chair of Computer Systems Test and Verification, Other staff (0,75)
1998–2001   
Tallinn University of Technology , School of Information Technologies, Department of Computer Engineering , Chair of Computer Systems Test and Verification, Other staff (0,50)
1994–1998   
Tallinn University of Technology , School of Information Technologies, Department of Computer Control, Chair of Circuit Theory and Design, Other staff (0,50)
 
 
Education
2003–2007   
2007: PhD (computer and systems engineering), TUT
2001–2002   
2002: MSc, TTU
1992–2001   
2001: Dip. Eng, TTU
 
 
R&D related managerial and administrative work
2005−2005   
European Test Symposium 2005
2005−2005   
Europan Board Test Workshop 2005
2000−2000   
Baltic Electronic Conference 2000

Qualifications

Academic degrees
Elmet Orasson, Doctor's Degree, 2007, (sup) Raimund Ubar, Hybrid Built-In Self-Test - Methods and Tools for Analsysis and Optimizatuion of BIST, Tallinn University of Technology School of Information Technologies, Department of Computer Engineering Chair of Computer Systems Test and Verification.
Elmet Orasson, Research Master's Degree, 2002, (sup) Raimund Ubar, Digitaalsüsteemide testi- ja diagnostikaalase õppetarkvara arendus (Development of educational software for test and diagnostics of digital devices), Tallinn University of Technology School of Information Technologies, Department of Computer Engineering.
 
 
Honours & awards
2004, Elmet Orasson, Stipendium from Estonian Information Technology Foundation
2003, Elmet Orasson, Stipendium from Estonian Information Technology Foundation
 
 
Field of research
FIELD OF RESEARCH: 4. Natural Sciences and Engineering; 4.6. Computer Sciences; CERCS SPECIALITY: T120 Systems engineering, computer technology
FIELD OF RESEARCH: 4. Natural Sciences and Engineering; 4.8. Electrical Engineering and Electronics
 
 

Projects in progress

Publications

Category
Year
Publication
 
3.1.
2016
Kostin, Sergei; Orasson, Elmet; Ubar, Raimund (2016). A Tool Set for Teaching Design-for-Testability of Digital Circuits. In: Proc. of 11th European Workshop on Microelectronics Education. Southampton (1−6). IEEE Computer Society Press.
3.1.
2016
Ubar, R.; Jürimägi, L.; Orasson, E.; Raik, J. (2016). Scalable Algorithm for Structural Fault Collapsing in Digital Circuits. In: Y.Shin, C.Tsui, J.Kim, K.Choi, R.Reis (_EditorsAbbr). VLSI-SoC: Design for Reliability, Security, and Low Power (23−45). Springer.
3.1.
2016
Kostin, Sergei; Orasson, Elmet; Ubar, Raimund (2016). A Tool Set for Teaching Design-for-Testability of Digital Circuits. Proc. of 11th European Workshop on Microelectronics Education. Southampton, UK, May 11-13, 2016. IEEE Computer Society Press, 1−6.
3.1.
2016
Ubar, Raimund; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan (2016). Fault Collapsing in Digital Circuits Using Fast Fault Dominance and Equivalence Analysis with SSBDDs. In: Eds. Y.Shin, C.Tsui, J.Kim, K.Choi, R.Reis (_EditorsAbbr). VLSI-SoC: Design for Reliability, Security, and Low Power (23−45). Springer.
3.1.
2015
Ubar, Raimund; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan (2015). Scalable Algorithm for Structural Fault Collapsing in Digital Circuits. IFIP/IEEE International Conference on Very Large Scale Integration - VLSI-SoC'2015 (1−6). Oct. 5-7, 2015, Daejeon, Korea : IEEE Computer Society Press.
3.1.
2015
Ubar, Raimund; Jürimägi, Lembit; Orasson, Elmet; Josifovska, Galina; Oyeniran, Stephen Adeboye (2015). Double Phase Fault Collapsing with Linear Complexity in Digital Circuits. 18th Euromicro Conference on Digital Systems Design - DSD 2015 (1−6).. Funchal, Madeira, Portugal August 26-28, 2015: IEEE Computer Society Press.
3.1.
2012
Kruus, H.; Ubar, R.; Ellervee, P.; Gorev, M.; Pesonen, V.; Devadze, S.; Orasson, E.; Brik, M.; Min, M.; Annus, P.; Kruus, M.; Meigas, K. (2012). A Benchmark Suite for Evaluating the Efficiency of Test Tools. BEC 2012 : 13th biennial Baltic Electronics Conference : proceedings of the 13th biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2012, Tallinn, Estonia. Tallinn, 2012: The 13th Biennial Baltic Electronics Conference (BEC2012). Tallinn University of Technology, 85−88.
3.2.
2012
Ubar, Raimund; Kostin, Sergei; Orasson, Elmet; Evartson, Teet; Brik, Marina (2012). A Tool for Teaching Hierarchical Fault Diagnosis in Digital Circuits. Proc. of 9th European Workshop on Microelectronics Education – EWME’12. Grenoble, France: CNRS, 1−4.
3.2.
2010
Ubar, Raimund; Jutman, Artur; Raik, Jaan; Devadze, Sergei; Aleksejev, Igor; Chepurov, Anton; Chertov, Anton; Kostin, Sergei; Orasson, Elmet; Wuttke, H.-D. (2010). E-Learning Environment for WEB-Based Study of Testing. Proc. of the 8th European Workshop on Microelectronics Education - EWME 2010: 8th European Workshop on Microelectronics Education - EWME 2010. Saksamaa, Darmstadt, 47−52.
3.2.
2009
Ubar, R.; Raik, J.; Mironov, D.; Evartson, T.; Orasson, E.; Wuttke, H.-D.; Aarna, M. (2009). Teaching Diagnostic Modeling of Digital Systems with Decision Diagrams. Proc. of 12th IASTED Int. Conf. on Computers and Advanced Technology in Education – CATE 2009: 12th IASTED Int. Conf. on Computers and Advanced Technology in Education – CATE 2009, St. Thomas US, Nov. 22-24, 2009. ACTA Press, 1−6.
1.1.
2008
Jervan, G.; Orasson, E.; Kruus, H.; Ubar, R. (2008). Hybrid BIST Optimization Using Reseeding and Test Set Compaction. Microprocessors and Microsystems: Embedded Hardware Design, 32, 254−262.
1.2.
2007
Ubar, R.; Jutman, A.; Kruus, M.; Orasson, E.; Devadze, S.; Wuttke, H.-D. (2007). Learning Digital Test and Diagnostics via Internet. International Journal of Online Engineering, 3 (1), 1−9.
3.1.
2007
Jervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund (2007). Hybrid BIST Optimization Using Reseeding and Test Set Compaction. Proceedings of 10th EUROMICRO Conference on Digital System Design: 10th EUROMICRO Conference on Digital System Design (DSD 2007), Lübeck, Germany, 29-31 August 2007. IEEE Computer Society Press, 596−603.
3.1.
2007
Jervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund (2007). Optimization of Memory-Constrained Hybrid BIST for Testing Core-Based Systems. Proceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems - SIES'2007: IEEE 2nd International Symposium on Industrial Embedded Systems - SIES'2007, Lisbon, Portugal, 4-6 July 2007. IEEE Computer Society, 71−77.10.1109/SIES.2007.4297319.
3.1.
2006
Ubar, R.; Jervan, G.; Kruus, H.; Orasson, E.; Aleksejev, I. (2006). Optimization of the Store-and-Generate Based Built-In Self-Test. Proceedings of the 2006 International Baltic Electronic Conference: 10th Biennial Baltic Electronics Conference, Laulasmaa, Estonia, October 2-4, 2006. IEEE Computer Society Press, 199−202.10.1109/BEC.2006.311097.
3.5.
2006
Orasson, E (2006). E-learning software for digital test. Info- ja kommunikatsioonitehnoloogia doktorikooli aastakonverentsi artiklite kogumik (133−134).. Tallinna Tehnikaülikool.
3.1.
2005
Ubar, R.; Orasson, E.; Raik, J.; Wuttke, H. D. (2005). Teaching Advance Test Issues in Digital Electronics. ITHET 6th Annual International Conference, Juan Dolio, Dominican Republic.
3.4.
2005
Jutman, A.; Raik, J.; Orasson, E.; Ubar, R. (2005). Overview of the Educational Tools developed in REASON. Workshop on REsearch and Training Action for System on Chip DesigN – REASON, Tallinn, May 21, 2005.
3.1.
2004
Vislogubov, V; Jutman, Artur; Kruus, Helena; Orasson, Elmet; Raik, Jaan; Ubar, Raimund (2004). Diagnostic software with WEB interface for teaching purposes. BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia, 255−258.
3.4.
2004
Raik, J.; Orasson, E.; Ubar, R. (2004). Sequential Circuits BIST with Status BIT Control. Mixed design of integrated circuits and systems: International Conference MIXDES, Szczecin, Poland, 2004. 507−510.
3.4.
2004
Ubar, R.; Mazurova, N.; Smahtina, J.; Orasson, E.; Raik, J. (2004). HyFBIST: Hybrid Functional Built-In Self-Test in Microprogrammed Data-Paths of Digital Systems. Mixed design of integrated circuits and systems: MIXDES, Szczecin, Poland, 2004. 497−502.
3.4.
2004
Kruus, H.; Orasson, E.; Robal, T.; Ubar, R. (2004). Investigating Defects in Digital Circuits by Boolean Differential Equations. The 4th International Conference "Distance Learning - Educational Sphere of XXI Century": DLESC'04, Minsk, November 10-13, 2004. 432−435.
3.4.
2004
Ivask, E.; Jutman, A.; Orasson, E.; Raik, J.; Ubar, R.; Wuttke, H.-D. (2004). Research Environment for Teaching Digital Test. Proc. of 49. Int. Conf. IWK, Ilmenau, Germany, September 27-30, 2004: 49. Int. Conf. IWK, Ilmenau, Germany, September 27-30, 2004. 468−473.
1.2.
2003
Aarna, M.; Ivask, E.; Jutman, A.; Orasson, E.; Raik, J.; Ubar, R.; Vislogubov, V.; Wuttke, H.-D. (2003). Turbo Tester - Diagnostic Package for Research and Training. Radioelectronics & Informatics, 3 (24), 69−73.
3.1.
2003
Ubar, R.; Orasson, E. (2003). E-Learning tool and Exercises for Teaching Digital Test. 2nd IEEE Conference on Signals, Systems, Decision and Information Technology: Sousse, Tunisia, 2003. IEEE, 134.
3.4.
2003
Devadze, S.; Gorjachev, R.; Jutman, A.; Orasson, E.; Rosin, V.; Ubar, R. (2003). E-Learning Tools for Digital Test. Distance Learning – Educational Environment of the XXI Century: Minsk, Nov. 13-15, 2003. 336−342.
3.2.
2002
Ubar, R.; Orasson, E.; Evartson, T. (2002). Java Applet for Self-Learning of Digital Test Issues. Proceedings of 13th EAEEIE Conference: York, Great Britain.
3.2.
2002
Ubar, R.; Jutman, A.; Orasson, E.; Raik, J.; Evartson, T.; Wuttke, H.-D. (2002). Internet-Based Software for Teaching Test of Digital Circuits. Proceedings of 4th European Workshop on Microelectronics Education: EWME’02, Parador de Baiona, Spain, May 23-24, 2002. 317−320.
3.4.
2002
Ubar, R.; Orasson, E.; Evartson, T. (2002). Self-learning tool for digital test. 2nd Int. Conf. "Distance learning - educational sphere of the XXI century", Minsk, Belarus. 36−38.
3.4.
2002
Ubar, R.; Orasson, E.; Wuttke, H.-D. (2002). Internet-Based Software for Teaching Test of Digital Circuits. 23rd International Conference on Microelectronics, 2: 23rd International Conference on Microelectronics, Nis, Yugoslavia, 2002. IEEE, 659−662.
3.1.
2001
Ubar, Raimund; Jervan, Gert; Peng, Zebo; Orasson, Elmet; Raidma, Rein (2001). Fast Test Cost Calculation for Hybrid BIST in Digital Systems. Euromicro Symposium on Digital Systems Design, Warsaw, Poland, Sept. 4-6, 2001. IEEE Computer Society Press, 318−325.
3.4.
2000
Ubar, Raimund; Orasson, E; Raik, Jaan; Wuttke, H (2000). Combining learning, training and research in laboratory course for design and test. 7th Baltic Electronics Conference, Tallinn, October 8-11. 221−224.
3.4.
2000
Ubar, R.; Orasson, E.; Wuttke, H.-D. (2000). Interactive Teaching Software 'Introduction To Digital Test'. 45th International Conference, Ilmenau, Germany, 2000. 949−954.
25.04.2019
Detailne otsing
  • Leitud 17 kirjet
ProgrammLiikNumberNimiProjekti algusProjekti lõppVastutav täitjaAsutusFinantseerijapoolne rahastamine
MUUG3658 (ETF3658)Digitaalelektroonika disaini ja testi virtuaallaboratoorium01.01.199931.12.2002Raimund UbarTallinna Tehnikaülikool; Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut, Arvutisüsteemide diagnostika ja verifitseerimise õppetool 44 237,73 EUR
ETFETF5649Digitaalskeemide defekt-orienteeritud diagnostika01.01.200331.12.2006Raimund UbarTallinna Tehnikaülikool, Infotehnoloogia teaduskond40 819,99 EUR
SFSF0142508s03Digitaalsüsteemide disain ja test01.01.200331.12.2007Raimund UbarTallinna Tehnikaülikool, Infotehnoloogia teaduskond658 321,94 EUR
MUUT244 (0140244s98)Digitaalsüsteemide projekteerimise ja diagnostika alased uuringud, väljatöötlused ja rakendused01.01.199831.12.2002Raimund UbarTallinna Tehnikaülikool; Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut, Arvutisüsteemide diagnostika ja verifitseerimise õppetool 417 982,18 EUR
MUUF11007EAS eeluuring - Eeluuring mikroelektroonika kiipide tõrkekindlate 3D-arhitektuuride rakendusuuringule 7. raamprogrammi raames (3D-CHIP)02.11.201020.02.2011Jaan RaikTallinna Tehnikaülikool; Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut, Arvutisüsteemide diagnostika ja verifitseerimise õppetool 18 198,00 EUR
MUUF9077EAS eeluuring - Keerukate elektroonika-trükkplaatide tootmisvigade tuvastamistehnoloogia arendamine26.05.200924.09.2009Jaan RaikTallinna Tehnikaülikool; Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut, Arvutisüsteemide diagnostika ja verifitseerimise õppetool 14 164,42 EUR
MUUBF39EÜ 6. raamprogrammi teadusprojekti (STREP) kaasfinantseerimine06.04.200631.12.2006Raimund UbarTallinna Tehnikaülikool; Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut, Arvutisüsteemide diagnostika ja verifitseerimise õppetool 13 741,00 EUR
TKTAR8077Integreeritud elektroonikasüsteemide ja biomeditsiinitehnika tippkeskus CEBE07.07.200831.08.2015Raimund UbarTallinna Tehnikaülikool; Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut2 066 263,60 EUR
ETFETF7483Isediagnoosivad digitaalsüsteemid01.01.200831.12.2011Raimund UbarTallinna Tehnikaülikool, Infotehnoloogia teaduskond55 414,27 EUR
ETFETF5910Isetestivad digitaalsüsteemid01.01.200431.12.2007Raimund UbarTallinna Tehnikaülikool, Infotehnoloogia teaduskond51 822,58 EUR
MUUV152Kaugõppe tarkvara digitaalsüsteemide disaini ja testi valdkonnas, DILDIS01.01.199931.12.2005Raimund UbarTallinna Tehnikaülikool; Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut, Arvutisüsteemide diagnostika ja verifitseerimise õppetool 24 000,04 EUR
ETFETF6829Kiipvõrkudel põhinevate kiipsüsteemide veakindlus ja testimine01.01.200631.12.2009Gert JervanTallinna Tehnikaülikool, Infotehnoloogia teaduskond42 519,15 EUR
MUUG5637 (ETF5637)Kõrgtaseme testigenereerimine ja testitavuse analüüs digitaalskeemidele01.01.200331.12.2005Jaan RaikTallinna Tehnikaülikool; Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut, Arvutisüsteemide diagnostika ja verifitseerimise õppetool 17 538,06 EUR
SFSF0140041s08Töökindlate sardsüsteemide disain01.01.200831.12.2013Raimund UbarTallinna Tehnikaülikool, Infotehnoloogia teaduskond1 504 530,37 EUR
IUTIUT19-1Usaldusväärsed mitmetuumalised arvutisüsteemid01.01.201431.12.2019Jaan RaikTallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut; Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut1 572 000,00 EUR
MUUV170Uurimis- ja õppetöö meetodid valdkonnas 'Ühekiibisüsteemide disain'01.12.200130.11.2004Raimund UbarTallinna Tehnikaülikool; Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut, Arvutisüsteemide diagnostika ja verifitseerimise õppetool 124 627,71 EUR
MUUV195Virtuaalse infotehnoloogia teadusliku uurimis- ja arendustöö tippkeskuse rajamine01.11.200231.08.2005Raimund UbarTallinna Tehnikaülikool; Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutitehnika instituut, Arvutisüsteemide diagnostika ja verifitseerimise õppetool 137 346,13 EUR