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Olen nõus

Peep Adamson

https://www.etis.ee/CV/Peep_Adamson/est
19.12.1949
737 4653
peep.adamson@ut.ee

Teenistuskäik

Töökohad ja ametid
01.01.2016–30.04.2019   
Tartu Ülikool, Loodus- ja täppisteaduste valdkond, füüsika instituut, vanemteadur (1,00)
01.01.2008–31.12.2015   
Tartu Ülikool, Loodus- ja tehnoloogiateaduskond, Tartu Ülikooli Füüsika Instituut, vanemteadur (1,00)
01.01.2002–31.12.2007   
Tartu Ülikool, Loodus- ja tehnoloogiateaduskond, Tartu Ülikooli Füüsika Instituut, vanemteadur (1,00)
1997–2002   
Tartu Ülikool, Loodus- ja tehnoloogiateaduskond, Tartu Ülikooli Füüsika Instituut, Vanemteadur (1,00)
01.01.1990–31.12.1997   
Füüsika Instituut; Vanemteadur
01.01.1986–31.12.1990   
ETA Füüsika Instituut; Teadur
01.01.1975–31.12.1986   
ETA Füüsika Instituut; Insener, Nooremteadur
 
 
Haridustee
1968–1973   
Tartu Ülikool, teoreetiline füüsika
1965–1968   
Nõo Keskkool
 
 
Lisainfo
Õpetamine Tartu Ülikoolis:

Mikro- ja nano-optika (LOFY.01.034): 2009/2010, 2011/2012, 2013/2014, 2015/2016, 2017/2018
Aine elektrilised ja optilised omadused (FKEF.04.012): 2006/2007, 2007/2008, 2008/2009

Kvalifikatsioon

Teaduskraadid
Peep Adamson, doktorikraad, 1988, (juh) Karl Rebane; Vladimir Fedossejev, Теоретические исследования электромагнитных процессов в плоско-слоистых волноведущих структурах, ETA Füüsika Instituut.
 
 
Teadustöö põhisuunad
ETIS KLASSIFIKAATOR: 4. Loodusteadused ja tehnika; 4.10. Füüsika; TÄPSUSTUS: Nano- ja mikro-optika, pinnaoptika, (üli)õhukeste kilede optilised omadused,optiline diagnostika
 
 
Lisainfo
Füüsika-matemaatikakandidaat
Eesti TA Füüsika Instituut, 1988

Lõppenud projektid

Publikatsioonid

Klass
Aasta
Publikatsioon
 
1.1.
2019
Adamson, Peep (2019). Non-standard inversion method of ellipsometric equations for uniaxially anisotropic 2D materials on semiconductor or metallic substrates. Photonics and Nanostructures - Fundamentals and Applications, 37, 100743. DOI: 10.1016/j.photonics.2019.100743.
1.1.
2018
Adamson, P. (2018). A method for reducing the effect of surface contamination layers in reflection diagnostics of graphene-like 2D materials. NANO, 13 (4), 185044-1−185044-10.10.1142/S1793292018500443.
1.1.
2018
Adamson, P. (2018). Ellipsometry of anisotropic graphene‑like two‑dimensional materials on transparent substrates. Optical and Quantum Electronics, 50, 403-1−403-19.10.1007/s11082-018-1673-z.
1.1.
2017
Adamson, P. (2017). Reflectance calculations of anisotropic dielectric constants of graphene-like two-dimensional materials. Applied Optics, 56 (28), 7832−7840.10.1364/AO.56.007832.
1.1.
2017
Adamson, P. (2017). A sensitive reflection method for optical diagnostics of graphene layers. Optik, 138, 180−191.10.1016/j.ijleo.2017.02.086.
1.1.
2017
Adamson, P. (2017). A new ellipsometric approach for determining dielectric function of graphene in the infrared spectral region. Journal of Modern Optics, 64 (3), 272−279.10.1080/09500340.2016.1229510.
1.1.
2017
Adamson, P. (2017). Enhanced visibility of graphene: the effect of the Brewster angle. Optica Applicata, 47 (3), 363−372. DOI: 10.5277/oa170303.
1.1.
2015
Adamson, P. (2015). Correlation-free reflection diagnostics of graphene-like surface layers in the infrared region. Surface and interface Analysis, 47 (13), 1161−1165.10.1002/sia.5868.
1.1.
2014
Adamson, P. (2014). Characteristic Brewster angles for anisotropic interfaces. Optik, 125 (24), 7247−7257.10.1016/j.ijleo.2014.07.125.
1.1.
2014
Adamson, P. (2014). Infrared ellipsometry of nanometric anisotropic dielectric layers on absorbing materials. Infrared Physics & Technology, 64, 108−114.10.1016/j.infrared.2014.02.007.
1.1.
2014
Adamson, P. (2014). Analytic determination of n, k and d of two-dimensional materials by ellipsometry and reflectivity. Applied Optics, 53 (21), 4804−4810.10.1364/AO.53.004804.
1.1.
2014
Adamson, P. (2014). Ellipsometry of anisotropic (sub)nanometric dielectric films on absorbing materials. Journal of Modern Optics, 61 (5), 424−434.10.1080/09500340.2014.890255.
1.1.
2014
Adamson, P. (2014). Correlation-free ellipsometric characterization of uniaxially anisotropic nanolayers. Optik, 125 (1), 489−494.10.1016/j.ijleo.2013.07.019.
5.2.
2013
Möldre, Kristel; Tarre, Aivar; Adamson, Peep; Kahro, Tauno; Niilisk, Ahti; Aarik, Jaan (2013). Real-Time Optical Characterization of Atomic Layer Deposition of Dielectrics on Graphene. Book of Abstracts: International Conference "Functional Materials and Nanotechnologies 2013 - FM&NT2013"; Tartu, Estonia; April 21-24, 2013. _EditorsAbbr Plank, Toomas; Pärna, Rainer. Institute of Physics, University of Tartu, 223.
1.1.
2012
Adamson, P. (2012). Inverse relationships for ellipsometry of uniaxially anisotropic nanoscale dielectric films on isotropic materials. Optics Communications, 285, 3210−3216.10.1016/j.optcom.2012.02.060.
1.1.
2011
Adamson, P. (2011). Correlation-free reflection diagnostics of biaxially anisotropic nanoscale films on transparent isotropic materials. Journal of Modern Optics, 58 (18), 1618−1627.
1.1.
2011
Adamson, P. (2011). Reflection equivalence of inhomogeneous and uniaxially anisotropic dielectric films with optical axis normal to the film surface. Journal of Optics, 13 (9), 095703.10.1088/2040-8978/13/9/095703.
1.1.
2011
Adamson, P. (2011). Inverse relationships for reflection diagnostics of uniaxially anisotropic nanoscale films on isotropic materials. Applied Optics, 50 (17), 2773−2783.
1.2.
2011
Adamson, P. (2011). Reflection Properties of a Biaxially Anisotropic Dielectric Film in a Long-Wavelength Approximation. Progress In Electromagnetics Research B, 27, 37−59. DOI: 10.2528/PIERB10090104.
1.1.
2010
Adamson, P. (2010). Reflection of electromagnetic plane waves in a long-wavelength approximation from a multilayer system of anisotropic transparent films on non-absorbing isotropic medium. Waves in Random and Complex Media, 20 (3), 443−471.
1.2.
2010
Adamson, P. (2010). Reflection characterization of nanoscopically stratified surface structures and optical probing of anisotropic nanolayers. e-Journal of Surface Science and Nanotechnology, 8, 167−173.
1.1.
2009
Adamson, P. (2009). Optical diagnostics of anisotropic nanoscale films on transparent isotropic materials by integrating reflectivity and ellipsometry. Applied Optics, 48 (31), 5906−5916.
1.1.
2009
Adamson, P. (2009). Reflection characterization of anisotropic ultrathin dielectric films on absorbing isotropic substrates. Surface Science, 603 (21), 3227−3233. DOI: 10.1016/j.susc.2009.09.007.
1.1.
2009
Adamson, P. (2009). Laser probing of anisotropic ultrathin dielectric films on absorbing materials via differential reflection characteristics. Optics and Laser Technology, 41 (4), 424−430.
1.1.
2008
Adamson, P. (2008). Reflection of electromagnetic plane waves in a long-wavelength approximation from a multilayer system of anisotropic transparent films on absorbing medium. Waves in Random and Complex Media, 18 (4), 651−668. DOI: 10.1080/17455030802302142.
1.1.
2007
Adamson, P. (2007). Reflection of light from nanoscopically stratified anisotropic media and optical probing of dielectric nanofilms. Thin Solid Films, 515, 3730−3735.
1.1.
2006
Adamson, P. (2006). Optical diagnostics of nanoscale dielectric layers on interference films by polarization-dependent differential reflectivity. Optics Communications, 268 (1), 174−181.
1.1.
2006
Adamson, P. (2006). Reflection characterization of multilayer surface films. Surface Science, 600 (3), 735−742.
3.4.
2006
Adamson, P. (2006). Modeling of light reflection from nanodimensional anisotropic multilayer films on isotropic substrate. Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, 1: NSTI Nanotech; Boston, USA; May 7-11, 2006. USA: NSTI Press, 641−644.
1.1.
2005
Adamson, P. (2005). Scanning angle differential reflectometry around the Brewster angle to probe ultrathin dielectric films. Thin Solid Films, 492, 221−225.
1.1.
2005
Adamson, P. (2005). Reflection of light in the vicinity of the Brewster angle from a multilayer system of ultrathin inhomogeneous dielectric films. Journal of Modern Optics, 52 (10), 1457−1469.
3.1.
2005
Adamson, P. (2005). Characteristic reflection angles of nanoscopic layered media and optical probing of ultrathin dielectric films. In: Rosental, A. (Ed.). Optical Materials and Applications (336−345). . Bellingham: SPIE. (Proceedings of SPIE).
3.1.
2005
Adamson, P. (2005). Differential reflection characteristics for optical probing of nanoscale anisotropic layered system. International Conference on MEMS, NANO and Smart Systems; Banff, Canada; July 24-27, 2005. _EditorsAbbr Badawy, W.; Moussa, W. USA: IEEE Computer Society Press, 307−313.
5.2.
2005
Adamson, P. (2005). Long-wavelength approximation theory of light reflection from nanoscale anisotropic layered media. Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, 3. USA: NSTI Press, 664−667.
5.2.
2005
Adamson, P. (2005). Reflection characteristics of nanoscopic anisotropic layered structures and optical diagnostics of nanofilms. In 2005 Fifth IEEE Conference on Nanotechnology, NY, USA. , 409−412.
1.1.
2004
Adamson, P. (2004). High-aperture focusing systems: control of light concentration in focal region by pupil filtering. Journal of Modern Optics, 51 (1), 65−74.
1.1.
2004
Adamson, P. (2004). Reflection of light in a long-wavelength approximation from an N-layer system of inhomogeneous dielectric films and optical diagnostics of ultrathin layers. II. Transparent substrate. Journal of the Optical Society of America B: Optical Physics, 21 (3), 645−654.
1.1.
2004
Adamson, P. (2004). Laser diagnostics of nanoscale dielectric films on transparent substrate by integrating differential reflectivity and ellipsometry. Optics and Laser Technology, 36 (8), 661−668.
3.1.
2004
Adamson, P. (2004). Optical probing of nanoscopic insulating layered structures via differential characteristics of specular reflection of light. International Conference on MEMS, NANO and Smart Systems; Banff, Canada; August 25-27, 2004. _EditorsAbbr Badawy, W.; Moussa, W. USA: IEEE Computer Society Press, 535−541.
1.1.
2003
Adamson, P. (2003). Reflection of light in a long-wavelength approximation from an N-layer system of inhomogeneous dielectric films and optical diagnostics of ultrathin layers. I. Absorbing substrate. Journal of the Optical Society of America B: Optical Physics, 20 (4), 752−759.
3.1.
2003
Adamson, P. (2003). Reflection characteristics of nanoscopic layered structures and optical diagnostics of ultrathin dielectric films. 2: 2003 Third IEEE Conference on Nanotechnology (IEEE-NANO 2003); San Francisco, California; USA; August 12-14 2003. NY: IEEE, 836−839.
3.1.
2003
Adamson, P. (2003). Optical diagnostics of nanometer dielectric films by combining ellipsometry and differential reflectance. Physics, Chemistry and Application of Nanostructures: International Conference on Physics, Chemistry and Application of Nanostructures (Nanomeeting 2003); Minsk, Belarus; 20 - 23 May 2003. _EditorsAbbr Borisenko, V.E.; Gaponenko, V.; Gurin, V.S. Singapore: World Scientific, 96−99.
3.1.
2003
Adamson, P. (2003). Numerical analysis of transverse localization of radiation in freely propagating electromagnetic Bessel beams. Mathematical and Numerical Aspects of Wave Propagation: Sixth International Conference on Mathematical and Numerical Aspects of Wave Propagation; Jyväskylä, Finland; 30 June - 4 July 2003. _EditorsAbbr Cohen, GC.; Heikkola, E.; Joly, P.; Neittaanmaki, P. Heidelberg: Springer Verlag, 304−308.
1.1.
2002
Adamson, P. (2002). Laser diagnostics of nanoscale dielectric films on absorbing substrate by differential reflectivity and ellipsometry. Optics and Laser Technology, 34 (7), 561−568.
1.1.
2001
Adamson, PV. (2001). The influence of a multilayer system of inhomogeneous ultrathin films on reflection of light from dielectric materials (vol 89, pg 624, 2000). Optics and Spectroscopy, 90 (6), 943−943.
3.1.
2001
Adamson, P. (2001). Photoreflectance diagnostics of nanometer dielectric films. Physics, Chemistry and Application of Nanostructures - Reviews and Short Notes to Nanomeeting 2001: International Conference on Physics, Chemistry and Application of Nanostructures; Minsk, Byelarus; MAY 22-25, 2001. _EditorsAbbr Borisenko, V.E.; Gaponenko, V.; Gurin, V.S. Singapore: World Scientific, 206−209.
3.1.
2001
Adamson, P. (2001). Diagnostics of ultrathin dielectric layers by the method of differential reflection of light. Proceedings of the SPIE, 4415, 202−207.
1.1.
2000
Adamson, PV. (2000). Comparison of the high-aperture Bessel and Gaussian beams. Optics and Spectroscopy, 88 (2), 242−245.
1.1.
2000
Adamson, PV. (2000). Focused Bessel beams. Quantum Electronics, 30 (4), 365−369.
1.1.
2000
Adamson, PV. (2000). The influence of a multilayer system of inhomogeneous ultrathin films on reflection of light from dielectric materials. Optics and Spectroscopy, 89 (4), 624−630.
1.1.
2000
Adamson, PV. (2000). Antireflecting surface coatings with continuously varying complex refractive index. Technical Physics Letters, 26 (11), 1003−1006.
1.1.
1999
Rosental, A.; Tarre, A.; Adamson, P.; Gerst, A.; Kasikov, A.; Niilisk, A. (1999). Surface of TiO2 during atomic layer deposition as determined by incremental dielectric reflection. Applied Surface Science, 142, 204−209.
1.1.
1999
Adamson, PV. (1999). Differential reflection photometry of ultrathin dielectric layers on strongly absorbing materials. Optics and Spectroscopy, 86 (3), 408−414.
1.1.
1998
Adamson, PV. (1998). Effect of diffraction of light on the signal-to-noise ratio in thin-film optical memory based on spectral hole burning. Optics and Spectroscopy, 84 (2), 286−293.
1.1.
1998
Adamson, PV. (1998). Storage density and signal/noise ratio in a binary frequency-selective optical memory utilising multistage optical spectral hole burning. Quantum Electronics, 28 (9), 806−811.
1.1.
1998
Adamson, PV. (1998). Monitoring the deposition of an interference film by differential reflection of light. Technical Physics Letters, 24 (10), 822−825.
1.1.
1997
Rosental, A.; Adamson, P.; Gerst, A.; Koppel, H.; Tarre, A. (1997). Atomic layer deposition in traveling-wave reactor: In situ diagnostics by optical reflection. Applied Surface Science, 112, 82−86.
1.1.
1997
Adamson, PV. (1997). Interference enhancement of the sensitivity and the signal-to-noise ratio in differential spectrodensitometry of surface layers with normally reflected light. Optics and Spectroscopy, 82 (3), 403−409.
1.2.
1997
Adamson, PV. (1997). Photometric diagnostics of ultrathin dielectric layers by the method of differential reflection of light incident at the Brewster angle. Optics and Spectroscopy, 83 (1), 154−160.
3.1.
1997
Rosental, A.; Tarre, A.; Gerst, A.; Adamson, P.; Sammelselg, V.; Uustare, T. (1997). Atomic-layer-deposited TiO2 dielectric coatings. Optical Inorganic Dielectric Materials and Devices, 2967: International Conference on Advanced Optical Materials and Devices (AOMD 96) - Optical Inorganic Dielectric Materials and Devices; Riga, Latvia; 26-29 August, 1996. Ed. Krumins, A.; Millers, D.K.; Sternberg, A.; Spigulis, J. SPIE, 245−250. (Proceedings of SPIE).
1.1.
1996
Adamson, PV. (1996). New photometric technique for the optical diagnostics of clear material surface layers. Pisma v Zhurnal Tekhnicheskoi Fiziki, 22 (20), 38−45.
1.1.
1996
Rosental, A.; Adamson, P.; Gerst, A.; Niilisk, A. (1996). Monitoring of atomic layer deposition by incremental dielectric reflection. Applied Surface Science, 107, 178−183.
1.1.
1996
Adamson, PV. (1996). Differential reflection spectroscopy of surface layers on thick transparent substrates with normally incident light. Optika i Spektroskopiya, 80 (3), 512−523.
1.1.
1995
Adamson, PV. (1995). Differential photometric method for the determination of refractive index and thickness of superthin dielectrical films on transparent substrates. Pisma v Zhurnal Tekhnicheskoi Fiziki, 21 (14), 69−76.
1.1.
1994
Adamson, PV. (1994). Dependence of signal-noise ratio on recond-density in thin-film optical memory on spectral hole-burning. Pisma v Zhurnal Tekhnicheskoi Fiziki, 20 (4), 65−71.
1.1.
1994
Adamson, PV. (1994). Differential reflective spectroscopy of absorbing super-thin layers on transparent substrates with 2 mirror-image surfaces under the regular light incidence. Pisma v Zhurnal Tekhnicheskoi Fiziki, 20 (8), 44−50.
1.1.
1992
Adamson, PV. (1992). Optical attenuator on fiber couplers. Radiotehnika i Elektronika, 37 (6), 1137−1140.
1.1.
1991
Adamson, PV. (1991). An influence of multiple self-absorption of the spontaneous radiation upon the threshold pump level in heterolasers. Kvantovaya Elektronika, 18 (10), 1164−1169.
1.1.
1991
Adamson, PV. (1991). Beam description of multilayer film optical wave-guides. Optika i Spektroskopiya, 70 (1), 211−215.
1.1.
1991
Adamson, PV. (1991). Optical method of the determination of width of ultrathin layers of plane-layered periodic structures. Pisma v Zhurnal Tekhnicheskoi Fiziki, 17 (13), 26−31.
1.1.
1991
Adamson, PV. (1991). Role of photoactive absorption of intrinsic luminescence in multipass stripe heterostructures. Soviet Physics: Semiconductors, 25 (4), 368−370.
1.1.
1990
Adamson, PV. (1990). Rearrangement of the spectrum of optical waveguide coupled - mode damping. Optika i Spektroskopiya, 69 (2), 453−457.
1.1.
1990
Adamson, PV. (1990). Fiberoptic spectral filter. Pisma v Zhurnal Tekhnicheskoi Fiziki, 16 (22), 17−22.
1.1.
1990
Adamson, PV. (1990). On the optimization of film optical wave-guides. Kvantovaya Elektronika, 17 (10), 1357−1360.
1.1.
1990
Adamson, PV. (1990). To the theory of resonance tunnel coupling of lossy dielectric wave-guides. Izvestiya Vysshikh Uchebnykh Zavedenii Radiofizika, 33 (8), 970−975.
1.1.
1989
Adamson, PV. (1989). Beam description of the decay of planar optical-waveguide directed modes. Optika i Spektroskopiya, 66 (5), 1172−1174.
1.1.
1989
Fedoseev, VG.; Adamson, PV. (1989). Control of the spectral damping form of the guided tm-mode in metal-dielectric wave-guide. Zhurnal Tekhnicheskoi Fiziki, 59 (2), 183−185.
1.1.
1989
Adamson, PV. (1989). Increasing the heterolaser efficiency by multiple self-absorption of spontaneous emission. Pisma v Zhurnal Tekhnicheskoi Fiziki, 15 (23), 18−22.
1.1.
1989
Adamson, PV. (1989). Method for determination of damping the guided modes of film optical wave-guides. Zhurnal Tekhnicheskoi Fiziki, 59 (11), 106−107.
1.1.
1989
Adamson, PV. (1989). Radial method of calculation of damping (intensification) of guided modes of 5-layered dielectric wave-guides. Pisma v Zhurnal Tekhnicheskoi Fiziki, 15 (14), 71−75.
1.2.
1989
Adamson, P. (1989). Control of polarization characteristics of optical slab waveguides. Proceedings of the Estonian Academy of Sciences. Physics. Mathematics, 38 (3), 305−310.
1.1.
1988
Adamson, PV. (1988). Method for the determination of parameters of single-mode weakly-directed film optical wave-guides. Pisma v Zhurnal Tekhnicheskoi Fiziki, 14 (23), 2161−2164.
1.1.
1988
Adamson, PV. (1988). Wave-guide optical polarizator. Optika i Spektroskopiya, 65 (6), 1335−1337.
1.1.
1985
Fedoseev, VG.; Adamson, PV. (1985). Spectral width of polarization filters based on planar metal-dielectric wave-guides. Zhurnal Tekhnicheskoi Fiziki, 55 (8), 1582−1590.
1.1.
1984
Fedoseev, VG.; Adamson, PV. (1984). Determination method of simulated particles of dielectric permeability of metals. Pisma v Zhurnal Tekhnicheskoi Fiziki, 10 (8), 499−502.
1.1.
1983
Fedoseev, VG.; Adamson, PV. (1983). Mismatching of the te-mode and tm-mode of multilayer dielectric and metal-dielectric heterostructures. Kvantovaya Elektronika, 10 (2), 408−415.
1.1.
1983
Fedoseev, VG.; Adamson, PV. (1983). Some features in the absorption-spectrum of guided tm modes of metal-dielectric heterostructures with narrow-band electron excitations in the buffer layer. Kvantovaya Elektronika, 10 (10), 1981−1989.
1.1.
1982
Fedoseev, VG.; Adamson, PV. (1982). Waveguiding characteristics of planar dielectric heterostructures. Kvantovaya Elektronika, 9 (5), 993−1005.
1.2.
1982
Adamson, P. (1982). Power distribution of the guided modes of on asymmetric dielectric slab waveguide. Proceedings of the Estonian Academy of Sciences. Physics. Mathematics, 31 (4), 442−446.
1.1.
1981
Fedoseev, VG.; Adamson, PV. (1981). A comparison of the absorbtion and amplification factors of the orthogonal guidance modes of the symmetrical plane dielectrical waveguide. Zhurnal Tekhnicheskoi Fiziki, 51 (12), 2546−2549.
3.2.
1978
Adamson, P.; Rosental, A.; Fedoseev, V. (1978). The influence of mirror-reflecting of spontaneous radiation from metal contacts upon the heterolaser threshold current. A model of direct optical transitions. Tartu Riikliku Ülikooli Toimetised (97−102).. Tartu Riiklik Ülikool. (Heterosiirded. Elektroluminestsentsi-alased tööd; VII).
16.11.2019

Peep Adamson

https://www.etis.ee/CV/Peep_Adamson/eng
19.12.1949
737 4653
peep.adamson@ut.ee

Career

Institutions and positions
01.01.2008–31.12.2015   
University of Tartu, Faculty of Science and Technology (old), Institute of Physics, University of Tartu, Senior Research Fellow (1,00)
01.01.2002–31.12.2007   
University of Tartu, Faculty of Science and Technology (old), Institute of Physics, University of Tartu, Senior Research Fellow (1,00)
1997–2002   
University of Tartu, Faculty of Science and Technology (old), Institute of Physics, University of Tartu, Senior Researcher (1,00)
01.01.1990–31.12.1997   
Institute of Physics; Senior Researcher
01.01.1986–31.12.1990   
Institute of Physics, Estonian Acad. Sci.; Researcher
01.01.1975–31.12.1986   
Institute of Physics, Estonian Acad. Sci.; Engineer, Junior Researcher
 
 
Education
1968–1973   
University of Tartu, 1973, theoretical physics
 
 
Additional information
Teaching in University of Tartu:

Micro- and Nano-Optics (LOFY.01.034): 2009/2010, 2011/2012, 2013/2014, 2015/2016, 2017/2018
Electrical and Optical Properties of Materials (FKEF.04.012): 2006/2007, 2007/2008, 2008/2009

Qualifications

Academic degrees
Peep Adamson, Doctor's Degree, 1988, (sup) Karl Rebane; Vladimir Fedossejev, Теоретические исследования электромагнитных процессов в плоско-слоистых волноведущих структурах (Theoretical research of electromagnetic processes in layered waveguide structures), ETA Füüsika Instituut.
 
 
Fields of research
ETIS CLASSIFICATION: 4. Natural Sciences and Engineering; 4.10. Physics and Technical Physics; SPECIFICATION: Nano- and micro-optics, ultrathin films and surface optics, optical diagnostics
 
 
Additional information
Candidate of sciences (Ph.D)
Institute of Physics, Estonian Academy of Sciences, 1988

Completed projects

Publications

Category
Year
Publication
 
1.1.
2019
Adamson, Peep (2019). Non-standard inversion method of ellipsometric equations for uniaxially anisotropic 2D materials on semiconductor or metallic substrates. Photonics and Nanostructures - Fundamentals and Applications, 37, 100743. DOI: 10.1016/j.photonics.2019.100743.
1.1.
2018
Adamson, P. (2018). A method for reducing the effect of surface contamination layers in reflection diagnostics of graphene-like 2D materials. NANO, 13 (4), 185044-1−185044-10.10.1142/S1793292018500443.
1.1.
2018
Adamson, P. (2018). Ellipsometry of anisotropic graphene‑like two‑dimensional materials on transparent substrates. Optical and Quantum Electronics, 50, 403-1−403-19.10.1007/s11082-018-1673-z.
1.1.
2017
Adamson, P. (2017). Reflectance calculations of anisotropic dielectric constants of graphene-like two-dimensional materials. Applied Optics, 56 (28), 7832−7840.10.1364/AO.56.007832.
1.1.
2017
Adamson, P. (2017). A sensitive reflection method for optical diagnostics of graphene layers. Optik, 138, 180−191.10.1016/j.ijleo.2017.02.086.
1.1.
2017
Adamson, P. (2017). A new ellipsometric approach for determining dielectric function of graphene in the infrared spectral region. Journal of Modern Optics, 64 (3), 272−279.10.1080/09500340.2016.1229510.
1.1.
2017
Adamson, P. (2017). Enhanced visibility of graphene: the effect of the Brewster angle. Optica Applicata, 47 (3), 363−372. DOI: 10.5277/oa170303.
1.1.
2015
Adamson, P. (2015). Correlation-free reflection diagnostics of graphene-like surface layers in the infrared region. Surface and interface Analysis, 47 (13), 1161−1165.10.1002/sia.5868.
1.1.
2014
Adamson, P. (2014). Characteristic Brewster angles for anisotropic interfaces. Optik, 125 (24), 7247−7257.10.1016/j.ijleo.2014.07.125.
1.1.
2014
Adamson, P. (2014). Infrared ellipsometry of nanometric anisotropic dielectric layers on absorbing materials. Infrared Physics & Technology, 64, 108−114.10.1016/j.infrared.2014.02.007.
1.1.
2014
Adamson, P. (2014). Analytic determination of n, k and d of two-dimensional materials by ellipsometry and reflectivity. Applied Optics, 53 (21), 4804−4810.10.1364/AO.53.004804.
1.1.
2014
Adamson, P. (2014). Ellipsometry of anisotropic (sub)nanometric dielectric films on absorbing materials. Journal of Modern Optics, 61 (5), 424−434.10.1080/09500340.2014.890255.
1.1.
2014
Adamson, P. (2014). Correlation-free ellipsometric characterization of uniaxially anisotropic nanolayers. Optik, 125 (1), 489−494.10.1016/j.ijleo.2013.07.019.
5.2.
2013
Möldre, Kristel; Tarre, Aivar; Adamson, Peep; Kahro, Tauno; Niilisk, Ahti; Aarik, Jaan (2013). Real-Time Optical Characterization of Atomic Layer Deposition of Dielectrics on Graphene. Book of Abstracts: International Conference "Functional Materials and Nanotechnologies 2013 - FM&NT2013"; Tartu, Estonia; April 21-24, 2013. _EditorsAbbr Plank, Toomas; Pärna, Rainer. Institute of Physics, University of Tartu, 223.
1.1.
2012
Adamson, P. (2012). Inverse relationships for ellipsometry of uniaxially anisotropic nanoscale dielectric films on isotropic materials. Optics Communications, 285, 3210−3216.10.1016/j.optcom.2012.02.060.
1.1.
2011
Adamson, P. (2011). Correlation-free reflection diagnostics of biaxially anisotropic nanoscale films on transparent isotropic materials. Journal of Modern Optics, 58 (18), 1618−1627.
1.1.
2011
Adamson, P. (2011). Reflection equivalence of inhomogeneous and uniaxially anisotropic dielectric films with optical axis normal to the film surface. Journal of Optics, 13 (9), 095703.10.1088/2040-8978/13/9/095703.
1.1.
2011
Adamson, P. (2011). Inverse relationships for reflection diagnostics of uniaxially anisotropic nanoscale films on isotropic materials. Applied Optics, 50 (17), 2773−2783.
1.2.
2011
Adamson, P. (2011). Reflection Properties of a Biaxially Anisotropic Dielectric Film in a Long-Wavelength Approximation. Progress In Electromagnetics Research B, 27, 37−59. DOI: 10.2528/PIERB10090104.
1.1.
2010
Adamson, P. (2010). Reflection of electromagnetic plane waves in a long-wavelength approximation from a multilayer system of anisotropic transparent films on non-absorbing isotropic medium. Waves in Random and Complex Media, 20 (3), 443−471.
1.2.
2010
Adamson, P. (2010). Reflection characterization of nanoscopically stratified surface structures and optical probing of anisotropic nanolayers. e-Journal of Surface Science and Nanotechnology, 8, 167−173.
1.1.
2009
Adamson, P. (2009). Optical diagnostics of anisotropic nanoscale films on transparent isotropic materials by integrating reflectivity and ellipsometry. Applied Optics, 48 (31), 5906−5916.
1.1.
2009
Adamson, P. (2009). Reflection characterization of anisotropic ultrathin dielectric films on absorbing isotropic substrates. Surface Science, 603 (21), 3227−3233. DOI: 10.1016/j.susc.2009.09.007.
1.1.
2009
Adamson, P. (2009). Laser probing of anisotropic ultrathin dielectric films on absorbing materials via differential reflection characteristics. Optics and Laser Technology, 41 (4), 424−430.
1.1.
2008
Adamson, P. (2008). Reflection of electromagnetic plane waves in a long-wavelength approximation from a multilayer system of anisotropic transparent films on absorbing medium. Waves in Random and Complex Media, 18 (4), 651−668. DOI: 10.1080/17455030802302142.
1.1.
2007
Adamson, P. (2007). Reflection of light from nanoscopically stratified anisotropic media and optical probing of dielectric nanofilms. Thin Solid Films, 515, 3730−3735.
1.1.
2006
Adamson, P. (2006). Optical diagnostics of nanoscale dielectric layers on interference films by polarization-dependent differential reflectivity. Optics Communications, 268 (1), 174−181.
1.1.
2006
Adamson, P. (2006). Reflection characterization of multilayer surface films. Surface Science, 600 (3), 735−742.
3.4.
2006
Adamson, P. (2006). Modeling of light reflection from nanodimensional anisotropic multilayer films on isotropic substrate. Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, 1: NSTI Nanotech; Boston, USA; May 7-11, 2006. USA: NSTI Press, 641−644.
1.1.
2005
Adamson, P. (2005). Scanning angle differential reflectometry around the Brewster angle to probe ultrathin dielectric films. Thin Solid Films, 492, 221−225.
1.1.
2005
Adamson, P. (2005). Reflection of light in the vicinity of the Brewster angle from a multilayer system of ultrathin inhomogeneous dielectric films. Journal of Modern Optics, 52 (10), 1457−1469.
3.1.
2005
Adamson, P. (2005). Characteristic reflection angles of nanoscopic layered media and optical probing of ultrathin dielectric films. In: Rosental, A. (Ed.). Optical Materials and Applications (336−345). . Bellingham: SPIE. (Proceedings of SPIE).
3.1.
2005
Adamson, P. (2005). Differential reflection characteristics for optical probing of nanoscale anisotropic layered system. International Conference on MEMS, NANO and Smart Systems; Banff, Canada; July 24-27, 2005. _EditorsAbbr Badawy, W.; Moussa, W. USA: IEEE Computer Society Press, 307−313.
5.2.
2005
Adamson, P. (2005). Long-wavelength approximation theory of light reflection from nanoscale anisotropic layered media. Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, 3. USA: NSTI Press, 664−667.
5.2.
2005
Adamson, P. (2005). Reflection characteristics of nanoscopic anisotropic layered structures and optical diagnostics of nanofilms. In 2005 Fifth IEEE Conference on Nanotechnology, NY, USA. , 409−412.
1.1.
2004
Adamson, P. (2004). High-aperture focusing systems: control of light concentration in focal region by pupil filtering. Journal of Modern Optics, 51 (1), 65−74.
1.1.
2004
Adamson, P. (2004). Reflection of light in a long-wavelength approximation from an N-layer system of inhomogeneous dielectric films and optical diagnostics of ultrathin layers. II. Transparent substrate. Journal of the Optical Society of America B: Optical Physics, 21 (3), 645−654.
1.1.
2004
Adamson, P. (2004). Laser diagnostics of nanoscale dielectric films on transparent substrate by integrating differential reflectivity and ellipsometry. Optics and Laser Technology, 36 (8), 661−668.
3.1.
2004
Adamson, P. (2004). Optical probing of nanoscopic insulating layered structures via differential characteristics of specular reflection of light. International Conference on MEMS, NANO and Smart Systems; Banff, Canada; August 25-27, 2004. _EditorsAbbr Badawy, W.; Moussa, W. USA: IEEE Computer Society Press, 535−541.
1.1.
2003
Adamson, P. (2003). Reflection of light in a long-wavelength approximation from an N-layer system of inhomogeneous dielectric films and optical diagnostics of ultrathin layers. I. Absorbing substrate. Journal of the Optical Society of America B: Optical Physics, 20 (4), 752−759.
3.1.
2003
Adamson, P. (2003). Reflection characteristics of nanoscopic layered structures and optical diagnostics of ultrathin dielectric films. 2: 2003 Third IEEE Conference on Nanotechnology (IEEE-NANO 2003); San Francisco, California; USA; August 12-14 2003. NY: IEEE, 836−839.
3.1.
2003
Adamson, P. (2003). Optical diagnostics of nanometer dielectric films by combining ellipsometry and differential reflectance. Physics, Chemistry and Application of Nanostructures: International Conference on Physics, Chemistry and Application of Nanostructures (Nanomeeting 2003); Minsk, Belarus; 20 - 23 May 2003. _EditorsAbbr Borisenko, V.E.; Gaponenko, V.; Gurin, V.S. Singapore: World Scientific, 96−99.
3.1.
2003
Adamson, P. (2003). Numerical analysis of transverse localization of radiation in freely propagating electromagnetic Bessel beams. Mathematical and Numerical Aspects of Wave Propagation: Sixth International Conference on Mathematical and Numerical Aspects of Wave Propagation; Jyväskylä, Finland; 30 June - 4 July 2003. _EditorsAbbr Cohen, GC.; Heikkola, E.; Joly, P.; Neittaanmaki, P. Heidelberg: Springer Verlag, 304−308.
1.1.
2002
Adamson, P. (2002). Laser diagnostics of nanoscale dielectric films on absorbing substrate by differential reflectivity and ellipsometry. Optics and Laser Technology, 34 (7), 561−568.
1.1.
2001
Adamson, PV. (2001). The influence of a multilayer system of inhomogeneous ultrathin films on reflection of light from dielectric materials (vol 89, pg 624, 2000). Optics and Spectroscopy, 90 (6), 943−943.
3.1.
2001
Adamson, P. (2001). Photoreflectance diagnostics of nanometer dielectric films. Physics, Chemistry and Application of Nanostructures - Reviews and Short Notes to Nanomeeting 2001: International Conference on Physics, Chemistry and Application of Nanostructures; Minsk, Byelarus; MAY 22-25, 2001. _EditorsAbbr Borisenko, V.E.; Gaponenko, V.; Gurin, V.S. Singapore: World Scientific, 206−209.
3.1.
2001
Adamson, P. (2001). Diagnostics of ultrathin dielectric layers by the method of differential reflection of light. Proceedings of the SPIE, 4415, 202−207.
1.1.
2000
Adamson, PV. (2000). Comparison of the high-aperture Bessel and Gaussian beams. Optics and Spectroscopy, 88 (2), 242−245.
1.1.
2000
Adamson, PV. (2000). Focused Bessel beams. Quantum Electronics, 30 (4), 365−369.
1.1.
2000
Adamson, PV. (2000). The influence of a multilayer system of inhomogeneous ultrathin films on reflection of light from dielectric materials. Optics and Spectroscopy, 89 (4), 624−630.
1.1.
2000
Adamson, PV. (2000). Antireflecting surface coatings with continuously varying complex refractive index. Technical Physics Letters, 26 (11), 1003−1006.
1.1.
1999
Rosental, A.; Tarre, A.; Adamson, P.; Gerst, A.; Kasikov, A.; Niilisk, A. (1999). Surface of TiO2 during atomic layer deposition as determined by incremental dielectric reflection. Applied Surface Science, 142, 204−209.
1.1.
1999
Adamson, PV. (1999). Differential reflection photometry of ultrathin dielectric layers on strongly absorbing materials. Optics and Spectroscopy, 86 (3), 408−414.
1.1.
1998
Adamson, PV. (1998). Effect of diffraction of light on the signal-to-noise ratio in thin-film optical memory based on spectral hole burning. Optics and Spectroscopy, 84 (2), 286−293.
1.1.
1998
Adamson, PV. (1998). Storage density and signal/noise ratio in a binary frequency-selective optical memory utilising multistage optical spectral hole burning. Quantum Electronics, 28 (9), 806−811.
1.1.
1998
Adamson, PV. (1998). Monitoring the deposition of an interference film by differential reflection of light. Technical Physics Letters, 24 (10), 822−825.
1.1.
1997
Rosental, A.; Adamson, P.; Gerst, A.; Koppel, H.; Tarre, A. (1997). Atomic layer deposition in traveling-wave reactor: In situ diagnostics by optical reflection. Applied Surface Science, 112, 82−86.
1.1.
1997
Adamson, PV. (1997). Interference enhancement of the sensitivity and the signal-to-noise ratio in differential spectrodensitometry of surface layers with normally reflected light. Optics and Spectroscopy, 82 (3), 403−409.
1.2.
1997
Adamson, PV. (1997). Photometric diagnostics of ultrathin dielectric layers by the method of differential reflection of light incident at the Brewster angle. Optics and Spectroscopy, 83 (1), 154−160.
3.1.
1997
Rosental, A.; Tarre, A.; Gerst, A.; Adamson, P.; Sammelselg, V.; Uustare, T. (1997). Atomic-layer-deposited TiO2 dielectric coatings. Optical Inorganic Dielectric Materials and Devices, 2967: International Conference on Advanced Optical Materials and Devices (AOMD 96) - Optical Inorganic Dielectric Materials and Devices; Riga, Latvia; 26-29 August, 1996. Ed. Krumins, A.; Millers, D.K.; Sternberg, A.; Spigulis, J. SPIE, 245−250. (Proceedings of SPIE).
1.1.
1996
Adamson, PV. (1996). New photometric technique for the optical diagnostics of clear material surface layers. Pisma v Zhurnal Tekhnicheskoi Fiziki, 22 (20), 38−45.
1.1.
1996
Rosental, A.; Adamson, P.; Gerst, A.; Niilisk, A. (1996). Monitoring of atomic layer deposition by incremental dielectric reflection. Applied Surface Science, 107, 178−183.
1.1.
1996
Adamson, PV. (1996). Differential reflection spectroscopy of surface layers on thick transparent substrates with normally incident light. Optika i Spektroskopiya, 80 (3), 512−523.
1.1.
1995
Adamson, PV. (1995). Differential photometric method for the determination of refractive index and thickness of superthin dielectrical films on transparent substrates. Pisma v Zhurnal Tekhnicheskoi Fiziki, 21 (14), 69−76.
1.1.
1994
Adamson, PV. (1994). Dependence of signal-noise ratio on recond-density in thin-film optical memory on spectral hole-burning. Pisma v Zhurnal Tekhnicheskoi Fiziki, 20 (4), 65−71.
1.1.
1994
Adamson, PV. (1994). Differential reflective spectroscopy of absorbing super-thin layers on transparent substrates with 2 mirror-image surfaces under the regular light incidence. Pisma v Zhurnal Tekhnicheskoi Fiziki, 20 (8), 44−50.
1.1.
1992
Adamson, PV. (1992). Optical attenuator on fiber couplers. Radiotehnika i Elektronika, 37 (6), 1137−1140.
1.1.
1991
Adamson, PV. (1991). An influence of multiple self-absorption of the spontaneous radiation upon the threshold pump level in heterolasers. Kvantovaya Elektronika, 18 (10), 1164−1169.
1.1.
1991
Adamson, PV. (1991). Beam description of multilayer film optical wave-guides. Optika i Spektroskopiya, 70 (1), 211−215.
1.1.
1991
Adamson, PV. (1991). Optical method of the determination of width of ultrathin layers of plane-layered periodic structures. Pisma v Zhurnal Tekhnicheskoi Fiziki, 17 (13), 26−31.
1.1.
1991
Adamson, PV. (1991). Role of photoactive absorption of intrinsic luminescence in multipass stripe heterostructures. Soviet Physics: Semiconductors, 25 (4), 368−370.
1.1.
1990
Adamson, PV. (1990). Rearrangement of the spectrum of optical waveguide coupled - mode damping. Optika i Spektroskopiya, 69 (2), 453−457.
1.1.
1990
Adamson, PV. (1990). Fiberoptic spectral filter. Pisma v Zhurnal Tekhnicheskoi Fiziki, 16 (22), 17−22.
1.1.
1990
Adamson, PV. (1990). On the optimization of film optical wave-guides. Kvantovaya Elektronika, 17 (10), 1357−1360.
1.1.
1990
Adamson, PV. (1990). To the theory of resonance tunnel coupling of lossy dielectric wave-guides. Izvestiya Vysshikh Uchebnykh Zavedenii Radiofizika, 33 (8), 970−975.
1.1.
1989
Adamson, PV. (1989). Beam description of the decay of planar optical-waveguide directed modes. Optika i Spektroskopiya, 66 (5), 1172−1174.
1.1.
1989
Fedoseev, VG.; Adamson, PV. (1989). Control of the spectral damping form of the guided tm-mode in metal-dielectric wave-guide. Zhurnal Tekhnicheskoi Fiziki, 59 (2), 183−185.
1.1.
1989
Adamson, PV. (1989). Increasing the heterolaser efficiency by multiple self-absorption of spontaneous emission. Pisma v Zhurnal Tekhnicheskoi Fiziki, 15 (23), 18−22.
1.1.
1989
Adamson, PV. (1989). Method for determination of damping the guided modes of film optical wave-guides. Zhurnal Tekhnicheskoi Fiziki, 59 (11), 106−107.
1.1.
1989
Adamson, PV. (1989). Radial method of calculation of damping (intensification) of guided modes of 5-layered dielectric wave-guides. Pisma v Zhurnal Tekhnicheskoi Fiziki, 15 (14), 71−75.
1.2.
1989
Adamson, P. (1989). Control of polarization characteristics of optical slab waveguides. Proceedings of the Estonian Academy of Sciences. Physics. Mathematics, 38 (3), 305−310.
1.1.
1988
Adamson, PV. (1988). Method for the determination of parameters of single-mode weakly-directed film optical wave-guides. Pisma v Zhurnal Tekhnicheskoi Fiziki, 14 (23), 2161−2164.
1.1.
1988
Adamson, PV. (1988). Wave-guide optical polarizator. Optika i Spektroskopiya, 65 (6), 1335−1337.
1.1.
1985
Fedoseev, VG.; Adamson, PV. (1985). Spectral width of polarization filters based on planar metal-dielectric wave-guides. Zhurnal Tekhnicheskoi Fiziki, 55 (8), 1582−1590.
1.1.
1984
Fedoseev, VG.; Adamson, PV. (1984). Determination method of simulated particles of dielectric permeability of metals. Pisma v Zhurnal Tekhnicheskoi Fiziki, 10 (8), 499−502.
1.1.
1983
Fedoseev, VG.; Adamson, PV. (1983). Mismatching of the te-mode and tm-mode of multilayer dielectric and metal-dielectric heterostructures. Kvantovaya Elektronika, 10 (2), 408−415.
1.1.
1983
Fedoseev, VG.; Adamson, PV. (1983). Some features in the absorption-spectrum of guided tm modes of metal-dielectric heterostructures with narrow-band electron excitations in the buffer layer. Kvantovaya Elektronika, 10 (10), 1981−1989.
1.1.
1982
Fedoseev, VG.; Adamson, PV. (1982). Waveguiding characteristics of planar dielectric heterostructures. Kvantovaya Elektronika, 9 (5), 993−1005.
1.2.
1982
Adamson, P. (1982). Power distribution of the guided modes of on asymmetric dielectric slab waveguide. Proceedings of the Estonian Academy of Sciences. Physics. Mathematics, 31 (4), 442−446.
1.1.
1981
Fedoseev, VG.; Adamson, PV. (1981). A comparison of the absorbtion and amplification factors of the orthogonal guidance modes of the symmetrical plane dielectrical waveguide. Zhurnal Tekhnicheskoi Fiziki, 51 (12), 2546−2549.
3.2.
1978
Adamson, P.; Rosental, A.; Fedoseev, V. (1978). The influence of mirror-reflecting of spontaneous radiation from metal contacts upon the heterolaser threshold current. A model of direct optical transitions. Tartu Riikliku Ülikooli Toimetised (97−102).. Tartu Riiklik Ülikool. (Heterosiirded. Elektroluminestsentsi-alased tööd; VII).
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ETFETF7456Haruldaste muldmetallidega aktiveeritud metalloksiidide funktsionaliseerimine rakendusteks fosfoorides ja sensorites01.01.200831.12.2010Valter KiiskTartu Ülikool, Loodus- ja tehnoloogiateaduskond, Tartu Ülikooli Füüsika Instituut; Tartu Ülikool, Loodus- ja tehnoloogiateaduskond, Tartu Ülikooli Füüsika Instituut; Tartu Ülikool, Loodus- ja tehnoloogiateaduskond41 276,70 EUR
IUTIUT2-24Kilestruktuurid nanoelektroonika rakendusteks ja funktsionaalseteks pinnakateteks01.01.201331.12.2018Väino SammelselgTartu Ülikool, Loodus- ja täppisteaduste valdkond, füüsika instituut2 688 000,00 EUR
TKTK117Kõrgtehnoloogilised materjalid jätkusuutlikuks arenguks01.01.201131.12.2015Enn LustTartu Ülikool; Tallinna Tehnikaülikool, Keemia ja materjalitehnoloogia teaduskond; Tartu Ülikool, Loodus- ja tehnoloogiateaduskond, Tartu Ülikooli Füüsika Instituut; Tartu Ülikool, Loodus- ja tehnoloogiateaduskond, Tartu Ülikooli Keemia Instituut2 870 086,58 EUR
SFSF0382149s02Nanostruktuursed materjalid01.01.200231.12.2006Arnold RosentalTartu Ülikool, Loodus- ja tehnoloogiateaduskond, Tartu Ülikooli Füüsika Instituut792 696,19 EUR
SFSF0180046s07Pinnanähtused tahkisefüüsikas ja -tehnoloogias01.01.200731.12.2012Väino SammelselgTartu Ülikool, Loodus- ja tehnoloogiateaduskond, Tartu Ülikooli Füüsika Instituut1 590 665,57 EUR
TKSLTKT16141T (TK141)Uudsed materjalid ja kõrgtehnoloogilised seadmed energia salvestamise ja muundamise süsteemidele (TK141)01.01.201601.03.2023Enn LustTartu Ülikool, Loodus- ja täppisteaduste valdkond3 293 473,70 EUR