Projekti üldeesmärgiks on tehnoloogia vananemise ja diagnoositamatute vigade uurimine uutes nanoelektroonilistes protsessides. Projekti oodatavateks tulemusteks on defektide klassifitseerimine ning vananemisprotsessi uurimine uutes tehnoloogiates. Väljatöötatavate sard-testinstrumentide lahendused tuginevad IEEE P1687 standardile.
A group of European experts will jointly research ageing and NFF issues in modern nanoelectronics technologies. The project will investigate currently unknown defects, uncertain fault coverage and unclassified field returns. A new defect universe will be assembled and faults will be classified into comprehensive classes. BASTION will study the mechanisms of ageing and improve the longevity of electronic products. Embedded instrumentation and the IEEE P1687 standard will be applied to develop an ultra-low-latency, scalable error detection and localization infrastructure as well as to integrate all heterogeneous technologies into a homogeneous system.