Rapidly developing nanotechnology and nanodevice engineering demands of precise and deep understanding of nano object interaction with different surfaces. Nanowires (NW) are extremely interesting and promising type of materials used in nanotechnology, their rich and unique potential already demonstrated in numerous prototypes (field-effect transistors, light emitting diodes, nanorelays) and applications. Making a prototype often needs to place a NW at pre-determined positions. To do that in a controlled manner requires an understanding of the adhesion and friction forces between the NWs and the surface. Main task of this project is a systematic study of semiconducting nanowires adhesion and friction properties on different substrates using highly advanced instrumentation (AFM combined with FIB-SEM). SEM-FIB is the most appropriate instrument to cut NWs and study NWs friction properties in situ by AFM inside SEM. NW movement and deformation, caused by manipulation, are controlled by balance of NW adhesion to substrate and NW elastic properties. If adhesion force is higher than NW elastic deformation force, local deformation of NW occur. Investigation of elastic properties of NW will be done in parallel with friction measurements. Friction behavior of macro objects is influenced significantly by charging of their surface. Influence of electrostatic force on friction of NWs will be investigated. No similar systematic studies were realized yet. Implementation of this project will result a new knowledge, which is of high value for designing and operation of various nanosystems and nanodevices, stabilized by adhesion forces. This is complementary project to the realizing by Dr. R.Lohmus European project “Nanoparticle Manipulation with Atomic Force Microscopy Techniques”. It makes possible to use the same equipment already installed in the framework of European project and realize in parallel one more project with much smaller capital outlays.