Test Generation: A Hierarchical Approach

Jervan, Gert; Ubar, Raimund; Peng, Zebo; Eles, Petru (2005). Test Generation: A Hierarchical Approach. Reorda, Matteo Sonza; Peng, Zebo; Violante, Massimo. System-level Test and Validation of Hardware/Software Systems (65−78).. Springer. (Springer Series in Advanced Microelectronics; 17).
kogumikuartikkel/peatükk raamatus/kogumikus
Jervan, Gert; Ubar, Raimund; Peng, Zebo; Eles, Petru
System-level Test and Validation of Hardware/Software Systems
Reorda, Matteo Sonza; Peng, Zebo; Violante, Massimo
Springer
1-85233-899-7
Springer Series in Advanced Microelectronics
17
2005
6578
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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