Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopy

Kask, E.; Grossberg, M.; Josepson, R.; Salu, P.; Timmo, K.; Krustok, J. (2013). Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopy. Materials Science in Semiconductor Processing, 16 (3), 992−996.10.1016/j.mssp.2013.02.009.
ajakirjaartikkel
Kask, E.; Grossberg, M.; Josepson, R.; Salu, P.; Timmo, K.; Krustok, J.
  • Inglise
Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopy
Materials Science in Semiconductor Processing
1369-8001
16
3
2013
992996
Ilmunud
1.1. Teadusartiklid, mis on kajastatud Web of Science andmebaasides Science Citation Index Expanded, Social Sciences Citation Index, Arts & Humanities Citation Index ja/või andmebaasis Scopus (v.a. kogumikud)
WOS

Viited terviktekstile

dx.doi.org/10.1016/j.mssp.2013.02.009