Hierarchical Design Error Diagnosis in Combinational Circuits by Stuck-at Fault Test Patterns

Ubar, R.; Jutman, A. (1999). Hierarchical Design Error Diagnosis in Combinational Circuits by Stuck-at Fault Test Patterns. 6th International Conference on Mixed Design of Integrated Circuits and Systems, Kraków, Poland, June 17-19, 1999. 437−442.
publitseeritud konverentsiettekanne
Ubar, R.; Jutman, A.
6th International Conference on Mixed Design of Integrated Circuits and Systems, Kraków, Poland, June 17-19, 1999
1999
437442
Ilmunud
3.4. Artiklid/ettekanded, mis on avaldatud valdkonda 3.1. mittekuuluvates konverentsikogumikes

Viited terviktekstile

Lisainfo