Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints
Viilukas, Taavi; Karputkin, Anton; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund; Fujiwara, Hideo (2012). Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints. Journal of Electronic Testing-Theory and Applications, 28 (4), 511−521.
artikkel ajakirjas
Viilukas, Taavi; Karputkin, Anton; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund; Fujiwara, Hideo
Journal of Electronic Testing-Theory and Applications
28
4
2012
511–521
Ilmunud
1.1. Teadusartiklid, mis on kajastatud Web of Science andmebaasides Science Citation Index Expanded, Social Sciences Citation Index, Arts & Humanities Citation Index, Emerging Sources Citation Index ja/või andmebaasis Scopus (v.a. kogumikud)
Teadmata
WOS