Fast Parallel Fault Reasoning in Digital Circuits

Ubar, Raimund; Devadze, Sergei (2011). Fast Parallel Fault Reasoning in Digital Circuits. Design and Test Technology for Dependable Systems-on-chip (310−335).. USA, Hershey - New York: IGI Publishing.
kogumikuartikkel/peatükk raamatus/kogumikus
Ubar, Raimund; Devadze, Sergei
Design and Test Technology for Dependable Systems-on-chip
USA, Hershey - New York
IGI Publishing
978-1-6096-0212-3
2011
310335
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

Viited terviktekstile