Vacancies at the Cu-Nb semicoherent interface

Metsanurk, E.; Tamm, A.; Aabloo, A.; Klintenberg, M.; Caro, A. (2017). Vacancies at the Cu-Nb semicoherent interface. Modelling and Simulation in Materials Science and Engineering, 25 (2), ARTN 025012.10.1088/1361-651X/25/2/025012.
ajakirjaartikkel
Metsanurk, E.; Tamm, A.; Aabloo, A.; Klintenberg, M.; Caro, A.
  • Inglise
Modelling and Simulation in Materials Science and Engineering
BRISTOL
0965-0393
25
2
25
2017
ARTN 025012
9
Ilmunud
1.1. Teadusartiklid, mis on kajastatud Web of Science andmebaasides Science Citation Index Expanded, Social Sciences Citation Index, Arts & Humanities Citation Index ja/või andmebaasis Scopus (v.a. kogumikud)
WOS

Viited terviktekstile

dx.doi.org/10.1088/1361-651X/25/2/025012

Seotud asutused

Lisainfo

Article
vacancies; migration barrier; semicoherent meta-metal interface; density functional theory calculations