AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis

Silk, T.; Hong, Q.; Tamm, J.; Compton, RG. (1998). AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis. Synthetic Metals, 93 (1), 65−71.
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Silk, T.; Hong, Q.; Tamm, J.; Compton, RG.
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Synthetic Metals
Elsevier Science SA
0379-6779
93
1
1998
6571
7
Ilmunud
1.1. Teadusartiklid, mis on kajastatud Web of Science andmebaasides Science Citation Index Expanded, Social Sciences Citation Index, Arts & Humanities Citation Index ja/või andmebaasis Scopus (v.a. kogumikud)
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