Localization of single-gate design errors in combinational circuits by diagnostic information about stuck-at faults

"Ubar, Raimund-Johannes;Borrione, Dominique" (1998). Localization of single-gate design errors in combinational circuits by diagnostic information about stuck-at faults. 2nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems. Szczyrk (73−79).. Warsaw University of Technology.
kogumikuartikkel/peatükk raamatus/kogumikus
"Ubar, Raimund-Johannes;Borrione, Dominique"
2nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems. Szczyrk
Warsaw University of Technology
1998
7379
Ilmunud
3.4. Artiklid/ettekanded, mis on avaldatud valdkonda 3.1. mittekuuluvates konverentsikogumikes

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