Application Specific True Critical Paths Identification in Sequential Circuits

Jürimägi, Lembit; Ubar, Raimund; Jenihhin, Maksim; Raik, Jaan; Devadze, Sergei; Oyeniran, Adeboye. (2019). Application Specific True Critical Paths Identification in Sequential Circuits. 2019 25th IEEE International Symposium on On-Line Testing and Robust System Design: 25th IEEE International Symposium on On-Line Testing and Robust System Design Hotel Rodos Palace, Rhodes Island, Greece July 1-3, 2019. IEEE Computer Society, 1−6 [ilmumas].
publitseeritud konverentsiettekanne
Jürimägi, Lembit; Ubar, Raimund; Jenihhin, Maksim; Raik, Jaan; Devadze, Sergei; Oyeniran, Adeboye.
  • Inglise
2019 25th IEEE International Symposium on On-Line Testing and Robust System Design
25th IEEE International Symposium on On-Line Testing and Robust System Design Hotel Rodos Palace, Rhodes Island, Greece July 1-3, 2019
2019
16
Ilmumas
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