Defect creation caused by the decay of cation excitons and hot electron-hole recombination in wide-gap dielectrics

Lushchik, A; Lushchik, Ch; Kirm, M, Nagirny; V, Savikhin, F; Vasil’chenko, E. (2006). Defect creation caused by the decay of cation excitons and hot electron-hole recombination in wide-gap dielectrics. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Ato, 250, 330−336.
ajakirjaartikkel
Lushchik, A; Lushchik, Ch; Kirm, M, Nagirny; V, Savikhin, F; Vasil’chenko, E.
  • Inglise
Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Ato
250
B
2006
330336
Ilmunud
1.1. Teadusartiklid, mis on kajastatud Web of Science andmebaasides Science Citation Index Expanded, Social Sciences Citation Index, Arts & Humanities Citation Index ja/või andmebaasis Scopus (v.a. kogumikud)
WOS

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