IEEE 1687 Compliant Ecosystem for Embedded Instrumentation Access and In-Field Health Monitoring

Tsertov, Anton; Jutman, Artur; Shibin, Konstantin; Devadze, Sergei (2018). IEEE 1687 Compliant Ecosystem for Embedded Instrumentation Access and In-Field Health Monitoring. 2018 IEEE AUTOTESTCON: AUTOTESTCON’2018, National Harbor, Maryland, USA, Sept 17-20, 2018. Piscataway, NJ, USA: IEEE, 1−9.10.1109/AUTEST.2018.8532559.
publitseeritud konverentsiettekanne
Tsertov, Anton; Jutman, Artur; Shibin, Konstantin; Devadze, Sergei
  • Inglise
2018 IEEE AUTOTESTCON
AUTOTESTCON’2018, National Harbor, Maryland, USA, Sept 17-20, 2018
Piscataway, NJ, USA
IEEE
1558-4550
978-1-5386-5223-7
2018
19
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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doi.org/10.1109/AUTEST.2018.8532559

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