High-Level Test Data Generation for Software Based Self-Test in Microprocessors

Oyeniran, Adeboye Stephen; Jasnetski, Artjom; Tsertov, Anton; Ubar Raimund (2017). High-Level Test Data Generation for Software Based Self-Test in Microprocessors. In: Proceedings of MECO 2017 (1−6). IEEE Computer Cociety.
kogumikuartikkel/peatükk raamatus/kogumikus
Oyeniran, Adeboye Stephen; Jasnetski, Artjom; Tsertov, Anton; Ubar Raimund
  • Inglise
Proceedings of MECO 2017
IEEE Computer Cociety
2017
16
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

Viited terviktekstile

Lisainfo