Electronic and structural characterisation of Cu3BiS3 thin films for the absorber layer of sustainable photovoltaics

Yakushev, M.V.; Maiello, P; Raadik, T; Shaw, M.J.; Edwards, P.R.; Krustok, J.; Mudryi, A.V.; Forbes, I.; Martin, R.W. (2014). Electronic and structural characterisation of Cu3BiS3 thin films for the absorber layer of sustainable photovoltaics. Thin Solid Films, 562, 195−199./10.1016/j.tsf.2014.04.057.
ajakirjaartikkel
Yakushev, M.V.; Maiello, P; Raadik, T; Shaw, M.J.; Edwards, P.R.; Krustok, J.; Mudryi, A.V.; Forbes, I.; Martin, R.W.
  • Inglise
Thin Solid Films
0040-6090
562
2014
195199
Ilmunud
1.1. Teadusartiklid, mis on kajastatud Web of Science andmebaasides Science Citation Index Expanded, Social Sciences Citation Index, Arts & Humanities Citation Index ja/või andmebaasis Scopus (v.a. kogumikud)
WOS

Viited terviktekstile

dx.doi.org//10.1016/j.tsf.2014.04.057