Test Driven Domain Modelling

Piho, G.; Tepandi, J.; Parman, M.; Puusep, V.; Roost, M. (2011). Test Driven Domain Modelling. MIPRO 2011: 34th International Convention on Information and Communication Technology, Electronics and Microelectronics: May 23 - 27, 2011, Opatija, Croatia: Proceedings. Ed. Biljanović, P.; Skala, K.; Golubić, S.; et al. MIPRO, 576−581.
publitseeritud konverentsiettekanne
Piho, G.; Tepandi, J.; Parman, M.; Puusep, V.; Roost, M.
  • Inglise
MIPRO 2011: 34th International Convention on Information and Communication Technology, Electronics and Microelectronics: May 23 - 27, 2011, Opatija, Croatia: Proceedings
Biljanović, P.; Skala, K.; Golubić, S.; et al.
MIPRO
978-953-233-067-0
2011
576581
Ilmunud
3.2. Artiklid/peatükid lisas mitte loetletud kirjastuste välja antud kogumikes

Viited terviktekstile

Lisainfo