Run-Time Reconfigurable Instruments for Advanced Board-Level Testing

Aleksejev, I.; Jutman, A.; Devadze, S. (2017). Run-Time Reconfigurable Instruments for Advanced Board-Level Testing. Ieee Instrumentation & Measurement Magazine, 20 (4), 23−30.10.1109/MIM.2017.8006390.
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Aleksejev, I.; Jutman, A.; Devadze, S.
  • English
Ieee Instrumentation & Measurement Magazine
PISCATAWAY
Ieee-inst Electrical Electronics Engineers Inc
1094-6969
20
4
20
2017
2330
8
Ilmunud
1.1. Teadusartiklid, mis on kajastatud Web of Science andmebaasides Science Citation Index Expanded, Social Sciences Citation Index, Arts & Humanities Citation Index ja/või andmebaasis Scopus (v.a. kogumikud)
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doi.org/10.1109/MIM.2017.8006390

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