Ways for board and system test to benefit from FPGA embedded synthetic instrumentation

Ehrenberg H.; Jutman A.; Wenzel T.; Devadze S.; Odintsov S.; Aleksejev I.; (2019). Ways for board and system test to benefit from FPGA embedded synthetic instrumentation. Proc. of AUTOTESTCON’2019, Maryland, USA, 2019: AUTOTESTCON’2018, National Harbor, Maryland, USA, 2019. IEEE, [ilmumas].
publitseeritud konverentsiettekanne
Ehrenberg H.; Jutman A.; Wenzel T.; Devadze S.; Odintsov S.; Aleksejev I.;
  • Inglise
Proc. of AUTOTESTCON’2019, Maryland, USA, 2019
AUTOTESTCON’2018, National Harbor, Maryland, USA, 2019
2019
Ilmumas
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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