Combining symbolic techniques with topological approach in test generation

Ubar, Raimund-Johannes (1996). Combining symbolic techniques with topological approach in test generation. the 3rd Workshop on Mixed Design of Integrated Circuits and Systems (377−382).. TU Lodz.
kogumikuartikkel/peatükk raamatus/kogumikus
Ubar, Raimund-Johannes
the 3rd Workshop on Mixed Design of Integrated Circuits and Systems
TU Lodz
1996
377382
Ilmunud
3.4. Artiklid/ettekanded, mis on avaldatud valdkonda 3.1. mittekuuluvates konverentsikogumikes

Viited terviktekstile

Seotud asutused

Lisainfo