Synthesis of Multiple Fault Oriented Test Groups from Single Fault Test Sets

Ubar, Raimund; Kostin, Sergei; Raik, Jaan (2013). Synthesis of Multiple Fault Oriented Test Groups from Single Fault Test Sets. In: 8th Int. Conference on Design & Technology of Integrated Systems in Nanoscale Era - DTIS’13 (1−6). Abu-Dhabi, United Arab Emirates: IEEE Computer Society.
kogumikuartikkel/peatükk raamatus/kogumikus
Ubar, Raimund; Kostin, Sergei; Raik, Jaan
  • Inglise
8th Int. Conference on Design & Technology of Integrated Systems in Nanoscale Era - DTIS’13
Abu-Dhabi, United Arab Emirates
IEEE Computer Society
2013
16
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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