Combined Pseudo-Exhaustive and Deterministic Testing of Array Multipliers

Oyeniran, Adeboye Sephen; Payandeh Azad, Siavoosh; Ubar, Raimund (2018). Combined Pseudo-Exhaustive and Deterministic Testing of Array Multipliers. International Conference on Automation, Quality and Testing, Robotics, May 24-26, 2018, Cluj-Napoca, Romania. IEEE, 1−6.10.1109/AQTR.2018.8402747.
publitseeritud konverentsiettekanne
Oyeniran, Adeboye Sephen; Payandeh Azad, Siavoosh; Ubar, Raimund
  • Inglise
International Conference on Automation, Quality and Testing, Robotics, May 24-26, 2018, Cluj-Napoca, Romania
IEEE
ISBN 978-1-5386-2204-9
2018
16
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

Viited terviktekstile

doi.ieeecomputersociety.org/10.1109/AQTR.2018.8402747

Lisainfo

Multipliers, pseudo-exhaustive test, deterministic test sequences, data-controlled segmentation, extended fault class