Hierarchical Approach to Test Generation for Digital Systems at System, Circuit and Defect levels

Ubar, R. (2000). Hierarchical Approach to Test Generation for Digital Systems at System, Circuit and Defect levels. Proceedings of the 45th International Conference: Ilmenau (Germany), October 4-6, 2000. 711−716.
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Ubar, R.
Proceedings of the 45th International Conference
Ilmenau (Germany), October 4-6, 2000
2000
711716
Ilmunud
3.4. Artiklid/ettekanded, mis on avaldatud valdkonda 3.1. mittekuuluvates konverentsikogumikes

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