A new measure for calculating multiple fault coverage of microprocessor self-test

Adeboye Stephen Oyeniran ; Uzochukwu Eddie Odozi ; Raimund Ubar (2016). A new measure for calculating multiple fault coverage of microprocessor self-test. Electronics Conference (BEC), 2016 15th Biennial Baltic: Electronics Conference (BEC), 2016 15th Biennial Baltic, Estonia, 3-5 Oct. 2016. IEEE: IEEE Xplore, 75−78.10.1109/BEC.2016.7743732.
publitseeritud konverentsiettekanne
Adeboye Stephen Oyeniran ; Uzochukwu Eddie Odozi ; Raimund Ubar
  • Inglise
Electronics Conference (BEC), 2016 15th Biennial Baltic
Electronics Conference (BEC), 2016 15th Biennial Baltic, Estonia, 3-5 Oct. 2016
IEEE
IEEE Xplore
2382-820X
2016
7578
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

Viited terviktekstile

dx.doi.org/10.1109/BEC.2016.7743732

Seotud asutused

Tallinn University of Technology , Faculty of Information Technology, Department of Computer Engineering