Multiple Fault Testing in Systems-on-Chip with High-Level Decision Diagrams

Ubar, Raimund; Schölzel, Mario; Oyeniran, Stephen Adeboye; Vierhaus, Heinrich T. (2015). Multiple Fault Testing in Systems-on-Chip with High-Level Decision Diagrams. Proceedings of 10th IEEE International Design & Test Symposium IDT'15: 10th IEEE International Design & Test Symposium IDT'15, Dead Sea, Jordan, December 14-16, 2015. Dead Sea Jordan: IEEE Computer Society, 66−71.
publitseeritud konverentsiettekanne
Ubar, Raimund; Schölzel, Mario; Oyeniran, Stephen Adeboye; Vierhaus, Heinrich T.
  • Inglise
Proceedings of 10th IEEE International Design & Test Symposium IDT'15
10th IEEE International Design & Test Symposium IDT'15, Dead Sea, Jordan, December 14-16, 2015
Dead Sea Jordan
IEEE Computer Society
2015
6671
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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