Micro-NRA and micro-3HIXE with 3He microbeam on samples exposed in ASDEX Upgrade and Pilot-PSI machines

Kelemen, Mitja; Založnik, Anže; Vavpetic,Primož; Pecˇovnik, Matic; Pelicon, Primož; Hakola, Antti; Lahtinen,Aki; Karhunen, Juuso; Piip, Kaarel; Paris, Peeter; Laan, Matti; Krieger, Karl; Oberkofler, Martin; Van der Meiden, Hennie; Markelj, Sabin (2017). Micro-NRA and micro-3HIXE with 3He microbeam on samples exposed in ASDEX Upgrade and Pilot-PSI machines. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Ato, 404, 179−184.10.1016/j.nimb.2017.01.072.
ajakirjaartikkel
Kelemen, Mitja; Založnik, Anže; Vavpetic,Primož; Pecˇovnik, Matic; Pelicon, Primož; Hakola, Antti; Lahtinen,Aki; Karhunen, Juuso; Piip, Kaarel; Paris, Peeter; Laan, Matti; Krieger, Karl; Oberkofler, Martin; Van der Meiden, Hennie; Markelj, Sabin
  • Inglise
ASDEX Upgrade ja Pilot-PSIs eksponeeritud proovide 3He ioonide mikrokiirega Micro NRA ja micro 3HIXE analüüs.
Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Ato
0168-583x
404
2017
179184
Ilmunud
1.1. Teadusartiklid, mis on kajastatud Web of Science andmebaasides Science Citation Index Expanded, Social Sciences Citation Index, Arts & Humanities Citation Index ja/või andmebaasis Scopus (v.a. kogumikud)
WOS

Viited terviktekstile

doi.org/10.1016/j.nimb.2017.01.072

Seotud asutused

Jožef Stefan Institute, Jamova 39, SI-1000 Ljubljana, Slovenia

Lisainfo

Article; Proceedings Paper
Keywords: Focused ion beams Deuterium 3He Nuclear reaction analysis