DefSim: A Remote Laboratory for Studying Physical Defects in CMOS Digital Circuits

Pleskacz, Witold; Stopjakova, Viera; Borejko, Tomasz; Jutman, Artur; Walkanis, Andrzej. (2008). DefSim: A Remote Laboratory for Studying Physical Defects in CMOS Digital Circuits. IEEE Transactions on Industrial Electronics, 55 (6), 2405−2415.
ajakirjaartikkel
Pleskacz, Witold; Stopjakova, Viera; Borejko, Tomasz; Jutman, Artur; Walkanis, Andrzej.
  • Inglise
IEEE Transactions on Industrial Electronics
0278-0046
55
6
Special Section on e-Learning and Remote Laboratories within Engineering Education
2008
24052415
Ilmunud
1.1. Teadusartiklid, mis on kajastatud Web of Science andmebaasides Science Citation Index Expanded, Social Sciences Citation Index, Arts & Humanities Citation Index ja/või andmebaasis Scopus (v.a. kogumikud)
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