Generation of tests for the localization of single gate design errors in combinational circuits using the stuck-at fault model

"Ubar, Raimund-Johannes;Borrione, Dominique" (1998). Generation of tests for the localization of single gate design errors in combinational circuits using the stuck-at fault model. 11th IEEE Brasilian Symposium on Integrated Circuit Design (51−54).. Los Alamitos: IEEE Computer Society.
kogumikuartikkel/peatükk raamatus/kogumikus
"Ubar, Raimund-Johannes;Borrione, Dominique"
11th IEEE Brasilian Symposium on Integrated Circuit Design
Los Alamitos
IEEE Computer Society
0-8186-8704-5
1998
5154
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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