Optimization of Memory-Constrained Hybrid BIST for Testing Core-Based Systems.

Jervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund (2007). Optimization of Memory-Constrained Hybrid BIST for Testing Core-Based Systems. Proceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems - SIES'2007: IEEE 2nd International Symposium on Industrial Embedded Systems - SIES'2007, Lisbon, Portugal, 4-6 July 2007. IEEE Computer Society, 71−77.10.1109/SIES.2007.4297319.
publitseeritud konverentsiettekanne
Jervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund
Proceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems - SIES'2007
IEEE 2nd International Symposium on Industrial Embedded Systems - SIES'2007, Lisbon, Portugal, 4-6 July 2007
IEEE Computer Society
2007
7177
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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dx.doi.org/10.1109/SIES.2007.4297319