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Fast and Efficient Static Compaction of Test Sequences Based on Greedy Algorithms

Raik, J.; Jutman, A.; Ubar, R. (2001). Fast and Efficient Static Compaction of Test Sequences Based on Greedy Algorithms. Proc. of 4th Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS'2001), Györ, Hungary, April 18-20, 2001: 4th Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS'2001), Györ, Hungary, April 18-20, 2001. 117−122.
publitseeritud konverentsiettekanne
Raik, J.; Jutman, A.; Ubar, R.
Proc. of 4th Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS'2001), Györ, Hungary, April 18-20, 2001
4th Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS'2001), Györ, Hungary, April 18-20, 2001
2001
117122
Ilmunud
3.4. Artiklid/ettekanded, mis on avaldatud valdkonda 3.1. mittekuuluvates konverentsikogumikes

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