Mixed-level identification of fault redundancy in microprocessors

Ubar, Raimund; Adeboye, Stephan Oveniran; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, Jaan. (2019). Mixed-level identification of fault redundancy in microprocessors. 2019 20th IEEE Latin American Test Symposium (LATS): 20th IEEE Latin American Test Symposium, Santiago, Chile, 11th - 13th March 2019. IEEE Computer Society, 1−6.
publitseeritud konverentsiettekanne
Ubar, Raimund; Adeboye, Stephan Oveniran; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, Jaan.
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2019 20th IEEE Latin American Test Symposium (LATS)
20th IEEE Latin American Test Symposium, Santiago, Chile, 11th - 13th March 2019
2019
16
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3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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