The measurement and tuning of SiC Diode Voltage Doubler represented as diffusion-welded stack

Toompuu, Jana; Sleptšuk, Natalja; Land, Raul; Korolkov, Oleg; Rang, Toomas (2018). The measurement and tuning of SiC Diode Voltage Doubler represented as diffusion-welded stack. Proceedings of Baltic Electronics Conference BEC2018: 16th Biennial Baltic Electronics Conference BEC2018, Tallinn, Estonia, October 8-10, 2018. Ed. Ants Koel, Peeter Ellervee. Tallinn: IEEE Catalog Number: CFP18BEC-USB,.10.1109/BEC.2018.8600963.
publitseeritud konverentsiettekanne
Toompuu, Jana; Sleptšuk, Natalja; Land, Raul; Korolkov, Oleg; Rang, Toomas
  • Inglise
The measurement and tuning of SiC Diode Voltage Doubler represented as diffusion-welded stack
Proceedings of Baltic Electronics Conference BEC2018
Ants Koel, Peeter Ellervee
16th Biennial Baltic Electronics Conference BEC2018, Tallinn, Estonia, October 8-10, 2018
Tallinn
978-1-5386-7311-9
2018
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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doi.org/10.1109/BEC.2018.8600963