High-level modeling and testing of multiple control faults in digital systems

Jasnetski, A.; Oyeniran, S. A.; Tsertov, A.; Schölzel, M.; Ubar, R. (2016). High-level modeling and testing of multiple control faults in digital systems. 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS): 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Kosice, 20-22 April 2016. IEEE, 1−6.
publitseeritud konverentsiettekanne
Jasnetski, A.; Oyeniran, S. A.; Tsertov, A.; Schölzel, M.; Ubar, R.
  • Inglise
19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Kosice, 20-22 April 2016
IEEE
2016
16
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

Viited terviktekstile