Fault Collapsing in Digital Circuits Using Fast Fault Dominance and Equivalence Analysis with SSBDDs.

Ubar, Raimund; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan (2016). Fault Collapsing in Digital Circuits Using Fast Fault Dominance and Equivalence Analysis with SSBDDs. In: Eds. Y.Shin, C.Tsui, J.Kim, K.Choi, R.Reis (Ed.). VLSI-SoC: Design for Reliability, Security, and Low Power (23−45). Springer.
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Ubar, Raimund; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan
  • Inglise
VLSI-SoC: Design for Reliability, Security, and Low Power
Eds. Y.Shin, C.Tsui, J.Kim, K.Choi, R.Reis
Springer
1868-4238
978-3-319-46096-3
2016
2345
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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