Hierarchical test generation for complex digital systems with control and data processing parts

"Ubar, Raimund-Johannes;Raik, Jaan" (1999). Hierarchical test generation for complex digital systems with control and data processing parts. “Test, Assembly and Packaging”, SEMICON Technical Symposium (43−52).. Singapur University of Technology.
kogumikuartikkel/peatükk raamatus/kogumikus
"Ubar, Raimund-Johannes;Raik, Jaan"
“Test, Assembly and Packaging”, SEMICON Technical Symposium
Singapur University of Technology
1999
4352
Ilmunud
3.4. Artiklid/ettekanded, mis on avaldatud valdkonda 3.1. mittekuuluvates konverentsikogumikes

Viited terviktekstile

Seotud asutused

Lisainfo