Filling a Gap in Board-Level At-Speed Test Coverage

Jutman; Artur (2015). Filling a Gap in Board-Level At-Speed Test Coverage. Proc. IEEE Int. Workshop on Defects, Adaptive Test, Yield and Data Analysis (DATA’2015): IEEE Int. Workshop on Defects, Adaptive Test, Yield and Data Analysis (DATA’2015), Anaheim, CA, USA, Oct 8-9, 2015. IEEE, 1−7.
publitseeritud konverentsiettekanne
Jutman; Artur
  • Inglise
Proc. IEEE Int. Workshop on Defects, Adaptive Test, Yield and Data Analysis (DATA’2015)
IEEE Int. Workshop on Defects, Adaptive Test, Yield and Data Analysis (DATA’2015), Anaheim, CA, USA, Oct 8-9, 2015
IEEE
2015
17
Ilmunud
3.4. Artiklid/ettekanded, mis on avaldatud valdkonda 3.1. mittekuuluvates konverentsikogumikes

Viited terviktekstile

Seotud asutused

  • Testonica Lab OÜ