Pattern based analysis of fractal manufacturing systems

Jääger, K.; Vain, J. (2005). Pattern based analysis of fractal manufacturing systems. Information Control Problems in Manufacturing 2004 (INCOM 2004) : A Proceedings Volume from the 11th IFAC Symposium, Salvador, Brasil, 5-7 April, 2004 (In two volumes). Ed. Kopacek, P.; Pereira, C.E.; Morel, G. Oxford: Elsevier, 431−436. (IFAC Proceedings Volumes; 37-4).10.1016/S1474-6670(17)36152-9.
publitseeritud konverentsiettekanne
Jääger, K.; Vain, J.
  • Inglise
Information Control Problems in Manufacturing 2004 (INCOM 2004) : A Proceedings Volume from the 11th IFAC Symposium, Salvador, Brasil, 5-7 April, 2004 (In two volumes)
Kopacek, P.; Pereira, C.E.; Morel, G.
Oxford
Elsevier
IFAC Proceedings Volumes
37-4
2005
431436
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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doi.org/10.1016/S1474-6670(17)36152-9

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