Improving statistical approach for memory leak detection using machine learning

Šor, V.; Treier, T.; Srirama, S. V. (2013). Improving statistical approach for memory leak detection using machine learning. 29th IEEE International Conference on Software Maintenance, Eindhoven, 22-28 Sept. 2013. IEEE, 544−547.10.1109/ICSM.2013.92.
publitseeritud konverentsiettekanne
Šor, V.; Treier, T.; Srirama, S. V.
  • Inglise
29th IEEE International Conference on Software Maintenance, Eindhoven, 22-28 Sept. 2013
IEEE
1063-6773
2013
544547
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

Viited terviktekstile

dx.doi.org/10.1109/ICSM.2013.92