Structural study of TiO2 thin films by micro-Raman spectroscopy

Niilisk, A; Moppel, M; Pärs, M; Sildos, I; Jantson, T; Avarmaa, T; Jaaniso, R; Aarik, J (2006). Structural study of TiO2 thin films by micro-Raman spectroscopy. Central European Journal of Physics, 4 (1), 105−116.10.1007/s11534-005-0009-3.
ajakirjaartikkel
Niilisk, A; Moppel, M; Pärs, M; Sildos, I; Jantson, T; Avarmaa, T; Jaaniso, R; Aarik, J
  • Inglise
Structural study of TiO2 thin films by micro-Raman spectroscopy
Central European Journal of Physics
1644-3608
4
1
2006
105116
Ilmunud
1.1. Teadusartiklid, mis on kajastatud Web of Science andmebaasides Science Citation Index Expanded, Social Sciences Citation Index, Arts & Humanities Citation Index ja/või andmebaasis Scopus (v.a. kogumikud)
WOS

Viited terviktekstile

dx.doi.org/10.1007/s11534-005-0009-3