New Categories of Safe Faults in a Processor-Based Embedded System

Gursoy, Cemil Cem; Jenihhin, Maksim; Oyeniran, Stephen; Piumatti, Davide; Raik, Jaan; Sonza Reorda, Matteo; Ubar, Raimund. (2019). New Categories of Safe Faults in a Processor-Based Embedded System. 2019 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Cluj-Napoca, Romania, April 24-26, 2019. IEEE Computer Society, 1−6.
publitseeritud konverentsiettekanne
Gursoy, Cemil Cem; Jenihhin, Maksim; Oyeniran, Stephen; Piumatti, Davide; Raik, Jaan; Sonza Reorda, Matteo; Ubar, Raimund.
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2019 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Cluj-Napoca, Romania, April 24-26, 2019
2019
16
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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