Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties

Kropman, D.; Kärner, T.; Dolgov, Sergei; Heinmaa, I.; Laas, T.; Londos, C. A. (2010). Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties. The 9th International Conference on Global Research and Education. Riga, Latvia, 231−233.
publitseeritud konverentsiettekanne
Kropman, D.; Kärner, T.; Dolgov, Sergei; Heinmaa, I.; Laas, T.; Londos, C. A.
  • Inglise
Si-SiO2 punktdefektide vastastikmõju lisanditega ja nende mõju piirpinna omadustele
The 9th International Conference on Global Research and Education
Riga, Latvia
978-9934-10-046-8
2010
231233
Ilmunud
3.4. Artiklid/ettekanded, mis on avaldatud valdkonda 3.1. mittekuuluvates konverentsikogumikes

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