Teaching Digital Test with BIST Analyzer

Jutman, A.; Tsertov, A.; Tsepurov, A.; Aleksejev, I.; Ubar, R.; Wuttke, H.-D. (2008). Teaching Digital Test with BIST Analyzer. 19th EAEEIE Annual Conference: Formal Proceedings: 19th EAEEIE Annual Conference June 29 - July 2, 2008 Tallinn, Estonia. Tallinn, Estonia: IEEE, 123−128.
publitseeritud konverentsiettekanne
Jutman, A.; Tsertov, A.; Tsepurov, A.; Aleksejev, I.; Ubar, R.; Wuttke, H.-D.
  • Inglise
19th EAEEIE Annual Conference: Formal Proceedings
19th EAEEIE Annual Conference June 29 - July 2, 2008 Tallinn, Estonia
Tallinn, Estonia
IEEE
2008
123128
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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