DefSim: CMOS Defects on Chip for Research and Education.

Pleskacz, Witold; Borejko, T; Walkanis, A; Stopjakova, Viera; Jutman, Artur; Ubar, Raimund. (2006). DefSim: CMOS Defects on Chip for Research and Education. Proceedings of the 7th IEEE Latin-American Test Workshop (74−79).. Buenos Aires: IEEE Computer Society Press.
kogumikuartikkel/peatükk raamatus/kogumikus
Pleskacz, Witold; Borejko, T; Walkanis, A; Stopjakova, Viera; Jutman, Artur; Ubar, Raimund.
Proceedings of the 7th IEEE Latin-American Test Workshop
Buenos Aires
IEEE Computer Society Press
2006
7479
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

Viited terviktekstile