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Defect Oriented Fault Coverage of 100% Stuck-at Fault Test Sets

Blyzniuk, M.; Cibakova, T.; Gramatova, E.; Kuzmicz, W.; Lobur, M.; Pleskacz, W.; Raik, J.; Ubar, R. (2000). Defect Oriented Fault Coverage of 100% Stuck-at Fault Test Sets. Proc. of the 7th International Conference on Mixed Design of Integrated Circuits and Systems. Gdynia (Poland), June 15-17, 2000: 7th International Conference on Mixed Design of Integrated Circuits and Systems. Gdynia (Poland), June 15-17, 2000. 511−516.
publitseeritud konverentsiettekanne
Blyzniuk, M.; Cibakova, T.; Gramatova, E.; Kuzmicz, W.; Lobur, M.; Pleskacz, W.; Raik, J.; Ubar, R.
Proc. of the 7th International Conference on Mixed Design of Integrated Circuits and Systems. Gdynia (Poland), June 15-17, 2000
7th International Conference on Mixed Design of Integrated Circuits and Systems. Gdynia (Poland), June 15-17, 2000
2000
511516
Ilmunud
3.4. Artiklid/ettekanded, mis on avaldatud valdkonda 3.1. mittekuuluvates konverentsikogumikes

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