X-ray absorption spectroscopy as a method for structural study of HfO2 and ZrO2 thin films

Rammula, R.; Aarik, J.; Kikas, A.; Käämbre, T.; Mändar, H.; Uustare, T.; Sammelselg, V. (2007). X-ray absorption spectroscopy as a method for structural study of HfO2 and ZrO2 thin films. Book of Abstracts: E-MRS 2007 Fall Meeting; Warsaw, Poland; 17-21 September 2007. Warsaw: Pielaszek Research, 101.
publitseeritud konverentsiettekanne
Rammula, R.; Aarik, J.; Kikas, A.; Käämbre, T.; Mändar, H.; Uustare, T.; Sammelselg, V.
  • Inglise
X-ray absorption spectroscopy as a method for structural study of HfO2 and ZrO2 thin films
Book of Abstracts
E-MRS 2007 Fall Meeting; Warsaw, Poland; 17-21 September 2007
Warsaw
Pielaszek Research
8389585162
2007
101
Ilmunud
5.2. Konverentsiteesid, mis ei kuulu valdkonda 5.1

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