Composition and thickness determination of thin oxide films: comparison of different programs and methods

Sammelselg, V.; Aarik, J.; Aidla, A.; Kasikov, A.; Heikinheimo, E.; Peussa, M.; Niinisto, L. (1999). Composition and thickness determination of thin oxide films: comparison of different programs and methods. Journal of Analytical Atomic Spectrometry, 14 (3), 523−527.
ajakirjaartikkel
Sammelselg, V.; Aarik, J.; Aidla, A.; Kasikov, A.; Heikinheimo, E.; Peussa, M.; Niinisto, L.
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Journal of Analytical Atomic Spectrometry
Royal Soc Chemistry
0267-9477
14
3
1999
523527
5
Ilmunud
1.1. Teadusartiklid, mis on kajastatud Web of Science andmebaasides Science Citation Index Expanded, Social Sciences Citation Index, Arts & Humanities Citation Index ja/või andmebaasis Scopus (v.a. kogumikud)
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