Experimental Comparison of Different Gate-Driver Configurations for Parallel-Connection of Normally-on SiC JFETs

Peftitsis, D.; Lim, J.-K.; Rabkowski, J.; Tolstoy, G.; Nee, H.-P. (2012). Experimental Comparison of Different Gate-Driver Configurations for Parallel-Connection of Normally-on SiC JFETs. 1: 7th International Power Electronics and Motion Control Conference (IPEMC). Harbin, China: IEEE, 16−22.10.1109/IPEMC.2012.6258832.
publitseeritud konverentsiettekanne
Peftitsis, D.; Lim, J.-K.; Rabkowski, J.; Tolstoy, G.; Nee, H.-P.
  • Inglise
7th International Power Electronics and Motion Control Conference (IPEMC)
Harbin, China
IEEE
1
2012
1622
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

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dx.doi.org/10.1109/IPEMC.2012.6258832

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