Design Error Localization in Digital Circuits by Stuck-At Fault Test Patterns

Jutman, A.; Ubar, R. (2000). Design Error Localization in Digital Circuits by Stuck-At Fault Test Patterns. IEEE 22nd International Conference on Microelectronics, Niś, Yugoslavia, May 14-17, 2000. 723−726.
publitseeritud konverentsiettekanne
Jutman, A.; Ubar, R.
IEEE 22nd International Conference on Microelectronics, Niś, Yugoslavia, May 14-17, 2000
2000
723726
Ilmunud
3.4. Artiklid/ettekanded, mis on avaldatud valdkonda 3.1. mittekuuluvates konverentsikogumikes

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