Optimization of the Store-and-Generate Based Built-In Self-Test

Ubar, R.; Jervan, G.; Kruus, H.; Orasson, E.; Aleksejev, I. (2006). Optimization of the Store-and-Generate Based Built-In Self-Test. Proceedings of the 2006 International Baltic Electronic Conference: 10th Biennial Baltic Electronics Conference, Laulasmaa, Estonia, October 2-4, 2006. IEEE Computer Society Press, 199−202.10.1109/BEC.2006.311097.
publitseeritud konverentsiettekanne
Ubar, R.; Jervan, G.; Kruus, H.; Orasson, E.; Aleksejev, I.
Proceedings of the 2006 International Baltic Electronic Conference
10th Biennial Baltic Electronics Conference, Laulasmaa, Estonia, October 2-4, 2006
IEEE Computer Society Press
978-1-4244-0414-8
2006
199202
Ilmunud
3.1. Artiklid/peatükid lisas loetletud kirjastuste välja antud kogumikes (kaasa arvatud Thomson Reuters Book Citation Index, Thomson Reuters Conference Proceedings Citation Index, Scopus refereeritud kogumikud)

Viited terviktekstile

dx.doi.org/10.1109/BEC.2006.311097